Capacitance-voltage characteristics of MOS capacitors with Ge nanocrystals embedded in ZrO2 gate material

Hye Ryoung Lee, Samjong Choi, Kyoungah Cho, Sangsig Kim

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Fingerprint Dive into the research topics of 'Capacitance-voltage characteristics of MOS capacitors with Ge nanocrystals embedded in ZrO<sub>2</sub> gate material'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy