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Carrier removal rates and deep traps in neutron irradiated n-GaN films
In Hwan Lee, A. Y. Polyakov, N. B. Smirnov, A. V. Govorkov, E. A. Kozhukhova, N. G. Kolin, V. M. Boiko, A. V. Korulin, S. J. Pearton
Research output: Contribution to journal › Article › peer-review
19
Citations
(Scopus)