Characteristics of a double gap resistive plate chamber for the endcap region of CMS/LHC: Data vs. simulation in avalanche mode

S. H. Ahn, S. Y. Bahk, B. Hong, S. J. Hong, D. H. Kang, T. I. Kang, K. H. Kim, T. J. Kim, Y. J. Kim, Y. U. Kim, D. G. Koo, H. W. Lee, K. S. Lee, S. J. Lee, J. K. Lim, D. H. Moon, S. K. Nam, J. K. Oh, S. Park, W. J. ParkJ. T. Rhee, M. S. Ryu, K. S. Sim

Research output: Contribution to journalConference article

17 Citations (Scopus)

Abstract

We present the detailed analysis of the time and charge signals of a prototype double gap resistive plate chamber for the endcap region of the compact muon solenoid detector at CERN LHC. We demonstrate that the operating high-voltage plateau can be extended at least up to 400 V with the present design. The simple avalanche multiplication model can reproduce the experimental charge spectra reasonably well at the beginning of the high-voltage plateau region. The effective Townsend coefficient is estimated in the avalanche mode operation.

Original languageEnglish
Pages (from-to)32-36
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume533
Issue number1-2
DOIs
Publication statusPublished - 2004 Nov 1
EventProceedings of the Seventh International Workshop on Resistive - Clermont-Ferrand, France
Duration: 2003 Oct 202003 Oct 22

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Keywords

  • Avalanche mode
  • CMS/LHC
  • Double gap RPC
  • Simulation

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

Ahn, S. H., Bahk, S. Y., Hong, B., Hong, S. J., Kang, D. H., Kang, T. I., Kim, K. H., Kim, T. J., Kim, Y. J., Kim, Y. U., Koo, D. G., Lee, H. W., Lee, K. S., Lee, S. J., Lim, J. K., Moon, D. H., Nam, S. K., Oh, J. K., Park, S., ... Sim, K. S. (2004). Characteristics of a double gap resistive plate chamber for the endcap region of CMS/LHC: Data vs. simulation in avalanche mode. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 533(1-2), 32-36. https://doi.org/10.1016/j.nima.2004.06.124