Characterization of catastrophic optical damage in Al-free InGaAs/InGaP 0.98 μm high-power lasers

K. H. Park; J. K. Lee; D. H. Jang; H. S. Cho; C. S. Park; K. E. Pyun; J. Y. Jeong; S. Nahm; J. Jeong

doi:10.1063/1.122557

Characterization of catastrophic optical damage in Al-free InGaAs/InGaP 0.98 μm high-power lasers

K. H. Park, J. K. Lee, D. H. Jang, H. S. Cho, C. S. Park, K. E. Pyun, J. Y. Jeong, S. Nahm, J. Jeong

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Abstract

Catastrophic optical damage (COD) in Al-free InGaAs/InGaP 0.98 μm lasers has been investigated using real-time electroluminescence (EL) and transmission electron microscopy (TEM). From EL images, we observed that multiple bright spots initiated from one of the facets and then propagated to the center of the cavity during the COD process. It is clarified by the TEM analysis that the propagation of bright spots resulted in 60-nm-wide Moiré fringe along the cavity and the crystalline phase of the active area became polycrystalline. Highly nonradiative polycrystalline phase of the active area is the major cause of COD failure in the Al-free 0.98 μm lasers.

Original language	English
Pages (from-to)	2567-2569
Number of pages	3
Journal	Applied Physics Letters
Volume	73
Issue number	18
DOIs	https://doi.org/10.1063/1.122557
Publication status	Published - 1998

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "Characterization of catastrophic optical damage in Al-free InGaAs/InGaP 0.98 μm high-power lasers",

abstract = "Catastrophic optical damage (COD) in Al-free InGaAs/InGaP 0.98 μm lasers has been investigated using real-time electroluminescence (EL) and transmission electron microscopy (TEM). From EL images, we observed that multiple bright spots initiated from one of the facets and then propagated to the center of the cavity during the COD process. It is clarified by the TEM analysis that the propagation of bright spots resulted in 60-nm-wide Moir{\'e} fringe along the cavity and the crystalline phase of the active area became polycrystalline. Highly nonradiative polycrystalline phase of the active area is the major cause of COD failure in the Al-free 0.98 μm lasers.",

author = "Park, {K. H.} and Lee, {J. K.} and Jang, {D. H.} and Cho, {H. S.} and Park, {C. S.} and Pyun, {K. E.} and Jeong, {J. Y.} and S. Nahm and J. Jeong",

year = "1998",

doi = "10.1063/1.122557",

language = "English",

volume = "73",

pages = "2567--2569",

journal = "Applied Physics Letters",

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TY - JOUR

T1 - Characterization of catastrophic optical damage in Al-free InGaAs/InGaP 0.98 μm high-power lasers

AU - Park, K. H.

AU - Lee, J. K.

AU - Jang, D. H.

AU - Cho, H. S.

AU - Park, C. S.

AU - Pyun, K. E.

AU - Jeong, J. Y.

AU - Nahm, S.

AU - Jeong, J.

PY - 1998

Y1 - 1998

N2 - Catastrophic optical damage (COD) in Al-free InGaAs/InGaP 0.98 μm lasers has been investigated using real-time electroluminescence (EL) and transmission electron microscopy (TEM). From EL images, we observed that multiple bright spots initiated from one of the facets and then propagated to the center of the cavity during the COD process. It is clarified by the TEM analysis that the propagation of bright spots resulted in 60-nm-wide Moiré fringe along the cavity and the crystalline phase of the active area became polycrystalline. Highly nonradiative polycrystalline phase of the active area is the major cause of COD failure in the Al-free 0.98 μm lasers.

AB - Catastrophic optical damage (COD) in Al-free InGaAs/InGaP 0.98 μm lasers has been investigated using real-time electroluminescence (EL) and transmission electron microscopy (TEM). From EL images, we observed that multiple bright spots initiated from one of the facets and then propagated to the center of the cavity during the COD process. It is clarified by the TEM analysis that the propagation of bright spots resulted in 60-nm-wide Moiré fringe along the cavity and the crystalline phase of the active area became polycrystalline. Highly nonradiative polycrystalline phase of the active area is the major cause of COD failure in the Al-free 0.98 μm lasers.

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JO - Applied Physics Letters

JF - Applied Physics Letters

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Characterization of catastrophic optical damage in Al-free InGaAs/InGaP 0.98 μm high-power lasers

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