Characterization of CMOS pixel detectors for digital X-ray imaging

Min Kook Cho, Ho Kyung Kim, Thorsten Graeve, Jung Min Kim

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

In order to develop a cost-effective digital X-ray imaging system, we considered a CMOS (complementary metal-oxide-semiconductor) photodiode array in conjunction with a scintillation screen. Imaging performance was evaluated in terms of MTF (modulation-transfer function), NPS (noise-power spectrum) and DQE (detective quantum efficiency). The presampled MTF was measured using a slanted-slit method. The NPS was determined by 2-dimensional Fourier analysis. Both the measured MTF and NPS, and a self-developed computational model for the X-ray spectral analysis were used to determine the spatial frequency-dependent DQE. From the measured MTF, the spatial resolution was found to be about 10.5 line pairs per millimeter (1p/mm). For a 45-kVp tungsten spectrum, the measured DQE around zero spatial frequency was about 40%.

Original languageEnglish
Pages (from-to)1052-1055
Number of pages4
JournalKey Engineering Materials
Volume321-323 II
Publication statusPublished - 2006 Oct 16

Fingerprint

Optical transfer function
Power spectrum
Pixels
Metals
Quantum efficiency
Detectors
Imaging techniques
X rays
Tungsten
Fourier analysis
Scintillation
Photodiodes
Imaging systems
Spectrum analysis
Oxide semiconductors
Costs

Keywords

  • Computed Tomography
  • Digital Radiography
  • DQE
  • MTF
  • NPS
  • X-ray imaging

ASJC Scopus subject areas

  • Ceramics and Composites
  • Chemical Engineering (miscellaneous)

Cite this

Cho, M. K., Kim, H. K., Graeve, T., & Kim, J. M. (2006). Characterization of CMOS pixel detectors for digital X-ray imaging. Key Engineering Materials, 321-323 II, 1052-1055.

Characterization of CMOS pixel detectors for digital X-ray imaging. / Cho, Min Kook; Kim, Ho Kyung; Graeve, Thorsten; Kim, Jung Min.

In: Key Engineering Materials, Vol. 321-323 II, 16.10.2006, p. 1052-1055.

Research output: Contribution to journalArticle

Cho, MK, Kim, HK, Graeve, T & Kim, JM 2006, 'Characterization of CMOS pixel detectors for digital X-ray imaging', Key Engineering Materials, vol. 321-323 II, pp. 1052-1055.
Cho, Min Kook ; Kim, Ho Kyung ; Graeve, Thorsten ; Kim, Jung Min. / Characterization of CMOS pixel detectors for digital X-ray imaging. In: Key Engineering Materials. 2006 ; Vol. 321-323 II. pp. 1052-1055.
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