Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy

Yeongkon Jeong, Soo Jong Park, Sang Hun Lee, Byeong Kwon Ju, Young Min Jhon, Minah Seo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We investigated degradation of organic light emitting diodes (OLED) by terahertz (THz) time-domain spectroscopy. Decreased reflectance at 0.84 THz was observed inferred from the electric degradation of OLED.

Original languageEnglish
Title of host publication23rd Opto-Electronics and Communications Conference, OECC 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538691458
DOIs
Publication statusPublished - 2018 Jul 1
Event23rd Opto-Electronics and Communications Conference, OECC 2018 - Jeju, Korea, Republic of
Duration: 2018 Jul 22018 Jul 6

Publication series

Name23rd Opto-Electronics and Communications Conference, OECC 2018

Conference

Conference23rd Opto-Electronics and Communications Conference, OECC 2018
CountryKorea, Republic of
CityJeju
Period18/7/218/7/6

Fingerprint

Terahertz spectroscopy
Organic light emitting diodes (OLED)
light emitting diodes
degradation
Degradation
spectroscopy
Spectroscopy
reflectance

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Hardware and Architecture
  • Atomic and Molecular Physics, and Optics

Cite this

Jeong, Y., Park, S. J., Lee, S. H., Ju, B. K., Jhon, Y. M., & Seo, M. (2018). Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy. In 23rd Opto-Electronics and Communications Conference, OECC 2018 [8730086] (23rd Opto-Electronics and Communications Conference, OECC 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/OECC.2018.8730086

Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy. / Jeong, Yeongkon; Park, Soo Jong; Lee, Sang Hun; Ju, Byeong Kwon; Jhon, Young Min; Seo, Minah.

23rd Opto-Electronics and Communications Conference, OECC 2018. Institute of Electrical and Electronics Engineers Inc., 2018. 8730086 (23rd Opto-Electronics and Communications Conference, OECC 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Jeong, Y, Park, SJ, Lee, SH, Ju, BK, Jhon, YM & Seo, M 2018, Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy. in 23rd Opto-Electronics and Communications Conference, OECC 2018., 8730086, 23rd Opto-Electronics and Communications Conference, OECC 2018, Institute of Electrical and Electronics Engineers Inc., 23rd Opto-Electronics and Communications Conference, OECC 2018, Jeju, Korea, Republic of, 18/7/2. https://doi.org/10.1109/OECC.2018.8730086
Jeong Y, Park SJ, Lee SH, Ju BK, Jhon YM, Seo M. Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy. In 23rd Opto-Electronics and Communications Conference, OECC 2018. Institute of Electrical and Electronics Engineers Inc. 2018. 8730086. (23rd Opto-Electronics and Communications Conference, OECC 2018). https://doi.org/10.1109/OECC.2018.8730086
Jeong, Yeongkon ; Park, Soo Jong ; Lee, Sang Hun ; Ju, Byeong Kwon ; Jhon, Young Min ; Seo, Minah. / Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy. 23rd Opto-Electronics and Communications Conference, OECC 2018. Institute of Electrical and Electronics Engineers Inc., 2018. (23rd Opto-Electronics and Communications Conference, OECC 2018).
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