Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy

Yeongkon Jeong; Soo Jong Park; Sang Hun Lee; Byeong Kwon Ju; Young Min Jhon; Minah Seo

doi:10.1109/OECC.2018.8730086

Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy

Yeongkon Jeong, Soo Jong Park, Sang Hun Lee, Byeong Kwon Ju, Young Min Jhon, Minah Seo

School of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We investigated degradation of organic light emitting diodes (OLED) by terahertz (THz) time-domain spectroscopy. Decreased reflectance at 0.84 THz was observed inferred from the electric degradation of OLED.

Original language	English
Title of host publication	23rd Opto-Electronics and Communications Conference, OECC 2018
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781538691458
DOIs	https://doi.org/10.1109/OECC.2018.8730086
Publication status	Published - 2018 Jul 1
Event	23rd Opto-Electronics and Communications Conference, OECC 2018 - Jeju, Korea, Republic of Duration: 2018 Jul 2 → 2018 Jul 6

Publication series

Name	23rd Opto-Electronics and Communications Conference, OECC 2018

Conference

Conference	23rd Opto-Electronics and Communications Conference, OECC 2018
Country	Korea, Republic of
City	Jeju
Period	18/7/2 → 18/7/6

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ASJC Scopus subject areas

Computer Networks and Communications
Hardware and Architecture
Atomic and Molecular Physics, and Optics

Cite this

Jeong, Y., Park, S. J., Lee, S. H., Ju, B. K., Jhon, Y. M., & Seo, M. (2018). Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy. In 23rd Opto-Electronics and Communications Conference, OECC 2018 [8730086] (23rd Opto-Electronics and Communications Conference, OECC 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/OECC.2018.8730086

Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy. / Jeong, Yeongkon; Park, Soo Jong; Lee, Sang Hun; Ju, Byeong Kwon; Jhon, Young Min; Seo, Minah.

23rd Opto-Electronics and Communications Conference, OECC 2018. Institute of Electrical and Electronics Engineers Inc., 2018. 8730086 (23rd Opto-Electronics and Communications Conference, OECC 2018).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Jeong, Y, Park, SJ, Lee, SH, Ju, BK, Jhon, YM & Seo, M 2018, Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy. in 23rd Opto-Electronics and Communications Conference, OECC 2018., 8730086, 23rd Opto-Electronics and Communications Conference, OECC 2018, Institute of Electrical and Electronics Engineers Inc., 23rd Opto-Electronics and Communications Conference, OECC 2018, Jeju, Korea, Republic of, 18/7/2. https://doi.org/10.1109/OECC.2018.8730086

Jeong Y, Park SJ, Lee SH, Ju BK, Jhon YM, Seo M. Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy. In 23rd Opto-Electronics and Communications Conference, OECC 2018. Institute of Electrical and Electronics Engineers Inc. 2018. 8730086. (23rd Opto-Electronics and Communications Conference, OECC 2018). https://doi.org/10.1109/OECC.2018.8730086

Jeong, Yeongkon ; Park, Soo Jong ; Lee, Sang Hun ; Ju, Byeong Kwon ; Jhon, Young Min ; Seo, Minah. / Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy. 23rd Opto-Electronics and Communications Conference, OECC 2018. Institute of Electrical and Electronics Engineers Inc., 2018. (23rd Opto-Electronics and Communications Conference, OECC 2018).

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Access to Document

10.1109/OECC.2018.8730086