Abstract
We investigated degradation of organic light emitting diodes (OLED) by terahertz (THz) time-domain spectroscopy. Decreased reflectance at 0.84 THz was observed inferred from the electric degradation of OLED.
| Original language | English |
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| Title of host publication | 23rd Opto-Electronics and Communications Conference, OECC 2018 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9781538691458 |
| DOIs | |
| Publication status | Published - 2018 Jul 1 |
| Event | 23rd Opto-Electronics and Communications Conference, OECC 2018 - Jeju, Korea, Republic of Duration: 2018 Jul 2 → 2018 Jul 6 |
Publication series
| Name | 23rd Opto-Electronics and Communications Conference, OECC 2018 |
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Conference
| Conference | 23rd Opto-Electronics and Communications Conference, OECC 2018 |
|---|---|
| Country | Korea, Republic of |
| City | Jeju |
| Period | 18/7/2 → 18/7/6 |
ASJC Scopus subject areas
- Computer Networks and Communications
- Hardware and Architecture
- Atomic and Molecular Physics, and Optics
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Cite this
Jeong, Y., Park, S. J., Lee, S. H., Ju, B. K., Jhon, Y. M., & Seo, M. (2018). Characterization of Degradation in Organic Light Emitting Diodes by Terahertz Spectroscopy. In 23rd Opto-Electronics and Communications Conference, OECC 2018 [8730086] (23rd Opto-Electronics and Communications Conference, OECC 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/OECC.2018.8730086