Characterization of GaN/Si(111) heteroepitaxy with variation of thickness grown by using Al xGa 1-xN superlattice intermediate layer

Hyung Seok Han, Dong Wook Kim, In Hwan Lee, Cheul Ro Lee, Chul Soo Sone

Research output: Contribution to journal › Article › peer-review

8 Citations (Scopus)

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Physics & Astronomy