Characterization of interdigital stub with defected ground structure

Seongmin Pyo, Jung Woo Baik, Dong Hyo Lee, Young Sik Kim

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A new scheme with an interdigital line and a defected ground structure for dual-band operation is dealt with in this letter. The proposed structure is analyzed using a series L-C resonator model added a parasitic shunt capacitance. The nonlinear phase of this structure is dependent on the dumbbell size of the defected ground. This proposed scheme is applicable for a short-ended stub circuit and a dual pass-band filter at the centre frequencies of 860 and 1810 MHz.

Original languageEnglish
Pages (from-to)1353-1356
Number of pages4
JournalMicrowave and Optical Technology Letters
Volume51
Issue number5
DOIs
Publication statusPublished - 2009 May 1

Fingerprint

Defected ground structures
Bandpass filters
Resonators
Capacitance
Networks (circuits)
shunts
capacitance
resonators
filters

Keywords

  • Defected ground structure
  • Dual-band
  • Filter

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Characterization of interdigital stub with defected ground structure. / Pyo, Seongmin; Baik, Jung Woo; Lee, Dong Hyo; Kim, Young Sik.

In: Microwave and Optical Technology Letters, Vol. 51, No. 5, 01.05.2009, p. 1353-1356.

Research output: Contribution to journalArticle

Pyo, Seongmin ; Baik, Jung Woo ; Lee, Dong Hyo ; Kim, Young Sik. / Characterization of interdigital stub with defected ground structure. In: Microwave and Optical Technology Letters. 2009 ; Vol. 51, No. 5. pp. 1353-1356.
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