Characterization of polyaniline thin films prepared by cluster beam deposition methods

H. Lim, B. J. Kim, Jong-Ho Choi

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Polyaniline (PANI) films have been prepared by applying neutral and ionized cluster beam deposition (NCBD and ICBD) methods. Spectroscopic studies demonstrate that the dominant chemical structure of the as-deposited PANI films corresponds to the reduced leucoemeraldine state in comparison to the initial emeraldine state. Atomic force microscopy (AFM) measurements show that the cluster beam deposition method is effective in producing uniform polymeric films consisting of the reduced PANI species.

Original languageEnglish
Pages (from-to)81-82
Number of pages2
JournalSynthetic Metals
Volume135-136
DOIs
Publication statusPublished - 2003 Apr 4

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Polyaniline
Thin films
polymeric films
thin films
atomic force microscopy
Polymer films
Atomic force microscopy
polyaniline

Keywords

  • Atomic force microscopy
  • Cluster beam deposition
  • Polyaniline thin film
  • UV-visible absorption spectroscopy
  • X-ray photoelectron spectroscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Polymers and Plastics

Cite this

Characterization of polyaniline thin films prepared by cluster beam deposition methods. / Lim, H.; Kim, B. J.; Choi, Jong-Ho.

In: Synthetic Metals, Vol. 135-136, 04.04.2003, p. 81-82.

Research output: Contribution to journalArticle

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