Characterization of Si3N4/SiC nanocomposite by Raman scattering and XPS

Woo Seok Cho, Yoon Suk Oh, Chang Sam Kim, Minoru Osada, Masato Kakihana, Dae-Soon Lim, Deock Soo Cheong

Research output: Contribution to journalArticle

29 Citations (Scopus)

Abstract

We have synthesized Si3N4/SiC nanocomposites using a commercial polymer. The formed Si3N4/SiC nanocomposites have been studied using Raman scattering and X-ray photoelectron spectroscopy (XPS). The Raman scattering measurements showed that the formation of SiC started at 1200°C and that the main phase was 3C-SiC. The XPS results suggested that the SiC nanoparticles were formed by a chemical reaction of Si provided from Si3N4 with free carbon obtained by pyrolysis of polymer. The XPS results also indicated that residual carbon reacted with N2 to form CNx, which remained as an impurity phase in the final product.

Original languageEnglish
Pages (from-to)255-259
Number of pages5
JournalJournal of Alloys and Compounds
Volume285
Issue number1-2 Complete
DOIs
Publication statusPublished - 1999 Jan 1
Externally publishedYes

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Raman scattering
Nanocomposites
X ray photoelectron spectroscopy
Polymers
Carbon
Chemical reactions
Pyrolysis
Impurities
Nanoparticles
silicon nitride

ASJC Scopus subject areas

  • Metals and Alloys

Cite this

Cho, W. S., Oh, Y. S., Kim, C. S., Osada, M., Kakihana, M., Lim, D-S., & Cheong, D. S. (1999). Characterization of Si3N4/SiC nanocomposite by Raman scattering and XPS. Journal of Alloys and Compounds, 285(1-2 Complete), 255-259. https://doi.org/10.1016/S0925-8388(99)00007-9

Characterization of Si3N4/SiC nanocomposite by Raman scattering and XPS. / Cho, Woo Seok; Oh, Yoon Suk; Kim, Chang Sam; Osada, Minoru; Kakihana, Masato; Lim, Dae-Soon; Cheong, Deock Soo.

In: Journal of Alloys and Compounds, Vol. 285, No. 1-2 Complete, 01.01.1999, p. 255-259.

Research output: Contribution to journalArticle

Cho, WS, Oh, YS, Kim, CS, Osada, M, Kakihana, M, Lim, D-S & Cheong, DS 1999, 'Characterization of Si3N4/SiC nanocomposite by Raman scattering and XPS', Journal of Alloys and Compounds, vol. 285, no. 1-2 Complete, pp. 255-259. https://doi.org/10.1016/S0925-8388(99)00007-9
Cho, Woo Seok ; Oh, Yoon Suk ; Kim, Chang Sam ; Osada, Minoru ; Kakihana, Masato ; Lim, Dae-Soon ; Cheong, Deock Soo. / Characterization of Si3N4/SiC nanocomposite by Raman scattering and XPS. In: Journal of Alloys and Compounds. 1999 ; Vol. 285, No. 1-2 Complete. pp. 255-259.
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