Abstract
Various characteristics of a thin liquid film in its vapor-phase are investigated using the molecular dynamics technique. Local distributions of the temperature, density, normal and tangential pressure components, and stress are calculated for various film thicknesses and temperature levels. Distributions of local stresses change considerably with respect to film thicknesses, and interfacial regions on both sides of the film start to overlap with each other as the film becomes thinner. Integration of the local stresses, i.e., the surface tension, however7 does not vary much regardless of the interfacial overlap. The minimum thickness of a liquid film before rupturing is estimated with respect to the calculation domain sizes and is compared with a simple theoretical relation.
| Original language | English |
|---|---|
| Pages (from-to) | 1477-1484 |
| Number of pages | 8 |
| Journal | KSME International Journal |
| Volume | 16 |
| Issue number | 11 |
| Publication status | Published - 2002 Nov 1 |
| Externally published | Yes |
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Keywords
- Interfacial Overlap
- Molecular Dynamics
- Surface Tension
- Thin Liquid Film
ASJC Scopus subject areas
- Mechanical Engineering
Cite this
Characterization of thin liquid films using molecular dynamics simulation. / Lee, Jaeil; Park, Seungho; Kwon, Oh Myoung; Choi, Young Ki; Lee, Joon Sik.
In: KSME International Journal, Vol. 16, No. 11, 01.11.2002, p. 1477-1484.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Characterization of thin liquid films using molecular dynamics simulation
AU - Lee, Jaeil
AU - Park, Seungho
AU - Kwon, Oh Myoung
AU - Choi, Young Ki
AU - Lee, Joon Sik
PY - 2002/11/1
Y1 - 2002/11/1
N2 - Various characteristics of a thin liquid film in its vapor-phase are investigated using the molecular dynamics technique. Local distributions of the temperature, density, normal and tangential pressure components, and stress are calculated for various film thicknesses and temperature levels. Distributions of local stresses change considerably with respect to film thicknesses, and interfacial regions on both sides of the film start to overlap with each other as the film becomes thinner. Integration of the local stresses, i.e., the surface tension, however7 does not vary much regardless of the interfacial overlap. The minimum thickness of a liquid film before rupturing is estimated with respect to the calculation domain sizes and is compared with a simple theoretical relation.
AB - Various characteristics of a thin liquid film in its vapor-phase are investigated using the molecular dynamics technique. Local distributions of the temperature, density, normal and tangential pressure components, and stress are calculated for various film thicknesses and temperature levels. Distributions of local stresses change considerably with respect to film thicknesses, and interfacial regions on both sides of the film start to overlap with each other as the film becomes thinner. Integration of the local stresses, i.e., the surface tension, however7 does not vary much regardless of the interfacial overlap. The minimum thickness of a liquid film before rupturing is estimated with respect to the calculation domain sizes and is compared with a simple theoretical relation.
KW - Interfacial Overlap
KW - Molecular Dynamics
KW - Surface Tension
KW - Thin Liquid Film
UR - http://www.scopus.com/inward/record.url?scp=0038179073&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0038179073&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0038179073
VL - 16
SP - 1477
EP - 1484
JO - Journal of Mechanical Science and Technology
JF - Journal of Mechanical Science and Technology
SN - 1738-494X
IS - 11
ER -