Charge accumulation characteristics in XLPE with heat treated semiconductive electrodes

Kwang Suck Suh; Kim Eunjoo; Han Min-Koo; T. Takada

doi:10.1109/ICSD.1992.225003

Charge accumulation characteristics in XLPE with heat treated semiconductive electrodes

Kwang Suck Suh, Kim Eunjoo, Han Min-Koo, T. Takada

Department of Materials Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Citations (Scopus)

Abstract

The characteristics of charge accumulation in XLPE (cross-linked polyethylene) with heat-treated semiconductive electrodes are investigated. Both fresh ones and vacuum degassed electrodes are used. Vacuum treatment reduces the amount of residual by-products of the crosslinking reaction, which helps the buildup of homocharges near the electrodes. This indicates that the heterocharge peak observed in XLPE is caused by such by-products. In addition, the negative charges are observed near both electrodes when the charge profiles are collected during the voltage application, whereas the heterocharges are observed when the charge profiles are collected after the removal of voltage. The observation of negative charges near both electrodes is attributed to the strong contribution of injected electrons near the cathode.

Original language	English
Title of host publication	Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	418-422
Number of pages	5
ISBN (Electronic)	0780301293, 9780780301290
DOIs	https://doi.org/10.1109/ICSD.1992.225003
Publication status	Published - 1992 Jan 1
Event	4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992 - Sestri Levante, Italy Duration: 1992 Jun 22 → 1992 Jun 25

Publication series

Name	Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992

Conference

Conference	4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992
Country	Italy
City	Sestri Levante
Period	92/6/22 → 92/6/25

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ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Polymers and Plastics

Cite this

Suh, K. S., Eunjoo, K., Min-Koo, H., & Takada, T. (1992). Charge accumulation characteristics in XLPE with heat treated semiconductive electrodes. In Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992 (pp. 418-422). [225003] (Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICSD.1992.225003

Charge accumulation characteristics in XLPE with heat treated semiconductive electrodes. / Suh, Kwang Suck; Eunjoo, Kim; Min-Koo, Han; Takada, T.

Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992. Institute of Electrical and Electronics Engineers Inc., 1992. p. 418-422 225003 (Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Suh, KS, Eunjoo, K, Min-Koo, H & Takada, T 1992, Charge accumulation characteristics in XLPE with heat treated semiconductive electrodes. in Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992., 225003, Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992, Institute of Electrical and Electronics Engineers Inc., pp. 418-422, 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992, Sestri Levante, Italy, 92/6/22. https://doi.org/10.1109/ICSD.1992.225003

Suh KS, Eunjoo K, Min-Koo H, Takada T. Charge accumulation characteristics in XLPE with heat treated semiconductive electrodes. In Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992. Institute of Electrical and Electronics Engineers Inc. 1992. p. 418-422. 225003. (Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992). https://doi.org/10.1109/ICSD.1992.225003

Suh, Kwang Suck ; Eunjoo, Kim ; Min-Koo, Han ; Takada, T. / Charge accumulation characteristics in XLPE with heat treated semiconductive electrodes. Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992. Institute of Electrical and Electronics Engineers Inc., 1992. pp. 418-422 (Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992).

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Access to Document

10.1109/ICSD.1992.225003