Abstract
The characteristics of charge accumulation in XLPE (cross-linked polyethylene) with heat-treated semiconductive electrodes are investigated. Both fresh ones and vacuum degassed electrodes are used. Vacuum treatment reduces the amount of residual by-products of the crosslinking reaction, which helps the buildup of homocharges near the electrodes. This indicates that the heterocharge peak observed in XLPE is caused by such by-products. In addition, the negative charges are observed near both electrodes when the charge profiles are collected during the voltage application, whereas the heterocharges are observed when the charge profiles are collected after the removal of voltage. The observation of negative charges near both electrodes is attributed to the strong contribution of injected electrons near the cathode.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 418-422 |
| Number of pages | 5 |
| ISBN (Electronic) | 0780301293, 9780780301290 |
| DOIs | |
| Publication status | Published - 1992 Jan 1 |
| Event | 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992 - Sestri Levante, Italy Duration: 1992 Jun 22 → 1992 Jun 25 |
Publication series
| Name | Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992 |
|---|
Conference
| Conference | 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992 |
|---|---|
| Country | Italy |
| City | Sestri Levante |
| Period | 92/6/22 → 92/6/25 |
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ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials
- Polymers and Plastics
Cite this
Charge accumulation characteristics in XLPE with heat treated semiconductive electrodes. / Suh, Kwang Suck; Eunjoo, Kim; Min-Koo, Han; Takada, T.
Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992. Institute of Electrical and Electronics Engineers Inc., 1992. p. 418-422 225003 (Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Charge accumulation characteristics in XLPE with heat treated semiconductive electrodes
AU - Suh, Kwang Suck
AU - Eunjoo, Kim
AU - Min-Koo, Han
AU - Takada, T.
PY - 1992/1/1
Y1 - 1992/1/1
N2 - The characteristics of charge accumulation in XLPE (cross-linked polyethylene) with heat-treated semiconductive electrodes are investigated. Both fresh ones and vacuum degassed electrodes are used. Vacuum treatment reduces the amount of residual by-products of the crosslinking reaction, which helps the buildup of homocharges near the electrodes. This indicates that the heterocharge peak observed in XLPE is caused by such by-products. In addition, the negative charges are observed near both electrodes when the charge profiles are collected during the voltage application, whereas the heterocharges are observed when the charge profiles are collected after the removal of voltage. The observation of negative charges near both electrodes is attributed to the strong contribution of injected electrons near the cathode.
AB - The characteristics of charge accumulation in XLPE (cross-linked polyethylene) with heat-treated semiconductive electrodes are investigated. Both fresh ones and vacuum degassed electrodes are used. Vacuum treatment reduces the amount of residual by-products of the crosslinking reaction, which helps the buildup of homocharges near the electrodes. This indicates that the heterocharge peak observed in XLPE is caused by such by-products. In addition, the negative charges are observed near both electrodes when the charge profiles are collected during the voltage application, whereas the heterocharges are observed when the charge profiles are collected after the removal of voltage. The observation of negative charges near both electrodes is attributed to the strong contribution of injected electrons near the cathode.
UR - http://www.scopus.com/inward/record.url?scp=85066896458&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85066896458&partnerID=8YFLogxK
U2 - 10.1109/ICSD.1992.225003
DO - 10.1109/ICSD.1992.225003
M3 - Conference contribution
AN - SCOPUS:85066896458
T3 - Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992
SP - 418
EP - 422
BT - Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992
PB - Institute of Electrical and Electronics Engineers Inc.
ER -