Charge accumulation characteristics in XLPE with heat treated semiconductive electrodes

Kwang Suck Suh, Kim Eunjoo, Han Min-Koo, T. Takada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

The characteristics of charge accumulation in XLPE (cross-linked polyethylene) with heat-treated semiconductive electrodes are investigated. Both fresh ones and vacuum degassed electrodes are used. Vacuum treatment reduces the amount of residual by-products of the crosslinking reaction, which helps the buildup of homocharges near the electrodes. This indicates that the heterocharge peak observed in XLPE is caused by such by-products. In addition, the negative charges are observed near both electrodes when the charge profiles are collected during the voltage application, whereas the heterocharges are observed when the charge profiles are collected after the removal of voltage. The observation of negative charges near both electrodes is attributed to the strong contribution of injected electrons near the cathode.

Original languageEnglish
Title of host publicationProceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages418-422
Number of pages5
ISBN (Electronic)0780301293, 9780780301290
DOIs
Publication statusPublished - 1992 Jan 1
Event4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992 - Sestri Levante, Italy
Duration: 1992 Jun 221992 Jun 25

Publication series

NameProceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992

Conference

Conference4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992
CountryItaly
CitySestri Levante
Period92/6/2292/6/25

Fingerprint

Electrodes
Byproducts
Vacuum
Electric potential
Polyethylene
Crosslinking
Polyethylenes
Cathodes
Hot Temperature
Electrons

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Polymers and Plastics

Cite this

Suh, K. S., Eunjoo, K., Min-Koo, H., & Takada, T. (1992). Charge accumulation characteristics in XLPE with heat treated semiconductive electrodes. In Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992 (pp. 418-422). [225003] (Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICSD.1992.225003

Charge accumulation characteristics in XLPE with heat treated semiconductive electrodes. / Suh, Kwang Suck; Eunjoo, Kim; Min-Koo, Han; Takada, T.

Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992. Institute of Electrical and Electronics Engineers Inc., 1992. p. 418-422 225003 (Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Suh, KS, Eunjoo, K, Min-Koo, H & Takada, T 1992, Charge accumulation characteristics in XLPE with heat treated semiconductive electrodes. in Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992., 225003, Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992, Institute of Electrical and Electronics Engineers Inc., pp. 418-422, 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992, Sestri Levante, Italy, 92/6/22. https://doi.org/10.1109/ICSD.1992.225003
Suh KS, Eunjoo K, Min-Koo H, Takada T. Charge accumulation characteristics in XLPE with heat treated semiconductive electrodes. In Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992. Institute of Electrical and Electronics Engineers Inc. 1992. p. 418-422. 225003. (Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992). https://doi.org/10.1109/ICSD.1992.225003
Suh, Kwang Suck ; Eunjoo, Kim ; Min-Koo, Han ; Takada, T. / Charge accumulation characteristics in XLPE with heat treated semiconductive electrodes. Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992. Institute of Electrical and Electronics Engineers Inc., 1992. pp. 418-422 (Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992).
@inproceedings{764f4bcc376c478ea3c71888a5c3d6ba,
title = "Charge accumulation characteristics in XLPE with heat treated semiconductive electrodes",
abstract = "The characteristics of charge accumulation in XLPE (cross-linked polyethylene) with heat-treated semiconductive electrodes are investigated. Both fresh ones and vacuum degassed electrodes are used. Vacuum treatment reduces the amount of residual by-products of the crosslinking reaction, which helps the buildup of homocharges near the electrodes. This indicates that the heterocharge peak observed in XLPE is caused by such by-products. In addition, the negative charges are observed near both electrodes when the charge profiles are collected during the voltage application, whereas the heterocharges are observed when the charge profiles are collected after the removal of voltage. The observation of negative charges near both electrodes is attributed to the strong contribution of injected electrons near the cathode.",
author = "Suh, {Kwang Suck} and Kim Eunjoo and Han Min-Koo and T. Takada",
year = "1992",
month = "1",
day = "1",
doi = "10.1109/ICSD.1992.225003",
language = "English",
series = "Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "418--422",
booktitle = "Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992",

}

TY - GEN

T1 - Charge accumulation characteristics in XLPE with heat treated semiconductive electrodes

AU - Suh, Kwang Suck

AU - Eunjoo, Kim

AU - Min-Koo, Han

AU - Takada, T.

PY - 1992/1/1

Y1 - 1992/1/1

N2 - The characteristics of charge accumulation in XLPE (cross-linked polyethylene) with heat-treated semiconductive electrodes are investigated. Both fresh ones and vacuum degassed electrodes are used. Vacuum treatment reduces the amount of residual by-products of the crosslinking reaction, which helps the buildup of homocharges near the electrodes. This indicates that the heterocharge peak observed in XLPE is caused by such by-products. In addition, the negative charges are observed near both electrodes when the charge profiles are collected during the voltage application, whereas the heterocharges are observed when the charge profiles are collected after the removal of voltage. The observation of negative charges near both electrodes is attributed to the strong contribution of injected electrons near the cathode.

AB - The characteristics of charge accumulation in XLPE (cross-linked polyethylene) with heat-treated semiconductive electrodes are investigated. Both fresh ones and vacuum degassed electrodes are used. Vacuum treatment reduces the amount of residual by-products of the crosslinking reaction, which helps the buildup of homocharges near the electrodes. This indicates that the heterocharge peak observed in XLPE is caused by such by-products. In addition, the negative charges are observed near both electrodes when the charge profiles are collected during the voltage application, whereas the heterocharges are observed when the charge profiles are collected after the removal of voltage. The observation of negative charges near both electrodes is attributed to the strong contribution of injected electrons near the cathode.

UR - http://www.scopus.com/inward/record.url?scp=85066896458&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85066896458&partnerID=8YFLogxK

U2 - 10.1109/ICSD.1992.225003

DO - 10.1109/ICSD.1992.225003

M3 - Conference contribution

AN - SCOPUS:85066896458

T3 - Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992

SP - 418

EP - 422

BT - Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics, ICSD 1992

PB - Institute of Electrical and Electronics Engineers Inc.

ER -