Combined study of X-ray reflectivity and atomic force microscopy on a surface-grafted phospholipid monolayer on a solid

Kwang Meyung Kim, Youngro Byun, Chulhee Kim, Tae Chul Kim, Do Young Noh, Kwanwoo Shin

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

We investigated the detailed structure of a surface-grafted phospholipid monolayer, which was polymerized in situ onto a methacryloyl-silanized solid surface. By the combined study of X-ray reflectivity and atomic force microscopy, the in situ polymerization step of the lipid molecules are sufficiently detailed to reveal the molecular structure of lipid molecules before and after in situ polymerization. From the data of the X-ray reflectivity, we confirmed that the in situ polymerization process produces a flat lipid monolayer structure and that the lipid monolayer is substantially grafted on a silanized surface by chemical bonding. After the polymerization and washing processes, the thickness of the head group was 9 Å and the thickness of the tail group was 21 Å. The surface morphology of the polymerized phospholipid monolayer obtained by the measurements of atomic force microscopy was consistent with the results of the X-ray reflectivity. The cross-sectional analysis shows that the surface coverage of lipid molecules, which are chemically grafted onto a silanized surface, is approximately 89%.

Original languageEnglish
Pages (from-to)107-113
Number of pages7
JournalJournal of Colloid and Interface Science
Volume284
Issue number1
DOIs
Publication statusPublished - 2005 Apr 1
Externally publishedYes

Fingerprint

Phospholipids
Lipids
Monolayers
Atomic force microscopy
X rays
Polymerization
Molecules
Washing
Molecular structure
Surface morphology

Keywords

  • Atomic force microscopy
  • In situ polymerization
  • Phospholipid monolayer
  • X-ray reflectivity

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • Surfaces, Coatings and Films
  • Colloid and Surface Chemistry

Cite this

Combined study of X-ray reflectivity and atomic force microscopy on a surface-grafted phospholipid monolayer on a solid. / Kim, Kwang Meyung; Byun, Youngro; Kim, Chulhee; Kim, Tae Chul; Noh, Do Young; Shin, Kwanwoo.

In: Journal of Colloid and Interface Science, Vol. 284, No. 1, 01.04.2005, p. 107-113.

Research output: Contribution to journalArticle

Kim, Kwang Meyung ; Byun, Youngro ; Kim, Chulhee ; Kim, Tae Chul ; Noh, Do Young ; Shin, Kwanwoo. / Combined study of X-ray reflectivity and atomic force microscopy on a surface-grafted phospholipid monolayer on a solid. In: Journal of Colloid and Interface Science. 2005 ; Vol. 284, No. 1. pp. 107-113.
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