Complex dielectric constant measurement of samples of various cross sections using a microwave impedance bridge

Jinsoo Joo, A. J. Epstein

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

A microwave impedance bridge covering from 8.2 to 12.4 GHz used for measuring complex dielectric constants over a wide temperature range is described. This apparatus is suited for materials formed into solid posts having different cross sections. The effective diameters for use in the analysis of circular, elliptical, or rectangular cross-section posts are presented. The effective diameters are applied to determine the complex dielectric constant of rectangular-shaped conducting polymer film. The frequency and temperature dependence of the dielectric constant and conductivity are presented, and compared with those obtained using a microwave cavity perturbation technique at 6.5 GHz. The bridge results are well suited for independent determination of the depolarization factor of a rectangular post for use in analysis of results of the cavity perturbation method.

Original languageEnglish
Pages (from-to)2653-2657
Number of pages5
JournalReview of Scientific Instruments
Volume65
Issue number8
DOIs
Publication statusPublished - 1994 Dec 1
Externally publishedYes

Fingerprint

Permittivity
Microwaves
impedance
permittivity
microwaves
cross sections
perturbation
cavities
Perturbation techniques
Depolarization
Conducting polymers
conducting polymers
Polymer films
depolarization
coverings
conductivity
Temperature
temperature dependence
temperature

ASJC Scopus subject areas

  • Instrumentation
  • Physics and Astronomy (miscellaneous)

Cite this

Complex dielectric constant measurement of samples of various cross sections using a microwave impedance bridge. / Joo, Jinsoo; Epstein, A. J.

In: Review of Scientific Instruments, Vol. 65, No. 8, 01.12.1994, p. 2653-2657.

Research output: Contribution to journalArticle

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