Compositional homogeneity and X-ray topographic analyses of CdTexSe1-x grown by the vertical Bridgman technique

U. N. Roy, A. E. Bolotnikov, G. S. Camarda, Y. Cui, A. Hossain, K. Lee, W. Lee, R. Tappero, Ge Yang, Y. Cui, A. Burger, R. B. James

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

We grew CdTexSe1-x crystals with nominal Se concentrations of 5%, 7%, and 10% by the vertical Bridgman technique, and evaluated their compositional homogeneity and structural quality at the NSLS' X-ray fluorescence and white beam X-ray topography beam lines. Both X-ray fluorescence and photoluminescence mapping revealed very high compositional homogeneity of the CdTexSe1-x crystals. We noted that those crystals with higher concentrations of Se were more prone to twinning than those with a lower content. The crystals were fairly free from strains and contained low concentrations of sub-grain boundaries and their networks.

Original languageEnglish
Pages (from-to)34-37
Number of pages4
JournalJournal of Crystal Growth
Volume411
DOIs
Publication statusPublished - 2015 Feb 1

Keywords

  • A1. Characterization
  • A1. Defects
  • A1. Te-inclusions
  • A1.Subgrain boundary
  • B2. CdTeSe
  • B2. Semiconducting II-VI materials

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry

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