Control chart pattern recognition of manufacturing process using wavelet feature-based artificial neural networks

Jun Seok Kim, Sang Hoon Park, Cheong Sool Park, Hyo Heon Ko, Sung Shick Kim, Jun-Geol Baek

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Control chart pattern recognition is one of the most important tools in the identification of process problems in modern manufacturing industries. Abnormal patterns including systematic, cyclic, drift, and shift could be involved with certain assignable causes. Conventional control charts could not inherently recognize these patterns. In this paper, multi-resolution wavelet analysis is used to extract features. A self-organizing map then generates cluster vectors with wavelet coefficients. Using these features, a back-propagation network classifies unnatural patterns. The performance evaluation result is better than those of other competitive methods.

Original languageEnglish
Pages (from-to)863-866
Number of pages4
JournalAdvanced Science Letters
Volume13
DOIs
Publication statusPublished - 2012 Jun 1

Fingerprint

Wavelet Analysis
pattern recognition
back propagation
wavelet analysis
Control Charts
neural network
artificial neural network
wavelet
Pattern Recognition
Pattern recognition
Artificial Neural Network
manufacturing
Wavelets
Manufacturing
Neural networks
Wavelet analysis
industry
Self organizing maps
manufacturing industry
Backpropagation

Keywords

  • Artificial neural network
  • Control charts
  • Feature extraction
  • Multi-class classification
  • Pattern recognition
  • Wavelet analysis

ASJC Scopus subject areas

  • Education
  • Health(social science)
  • Mathematics(all)
  • Energy(all)
  • Computer Science(all)
  • Environmental Science(all)
  • Engineering(all)

Cite this

Control chart pattern recognition of manufacturing process using wavelet feature-based artificial neural networks. / Kim, Jun Seok; Park, Sang Hoon; Park, Cheong Sool; Ko, Hyo Heon; Kim, Sung Shick; Baek, Jun-Geol.

In: Advanced Science Letters, Vol. 13, 01.06.2012, p. 863-866.

Research output: Contribution to journalArticle

Kim, Jun Seok ; Park, Sang Hoon ; Park, Cheong Sool ; Ko, Hyo Heon ; Kim, Sung Shick ; Baek, Jun-Geol. / Control chart pattern recognition of manufacturing process using wavelet feature-based artificial neural networks. In: Advanced Science Letters. 2012 ; Vol. 13. pp. 863-866.
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