Controlled assembly of carbon nanotube tip for AFM: Simulation & experiment

Chang Soo Han, June Ki Park, Ji Eun Kim, Eung Sug Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

To fabricate an atomic force microscope (AFM) tip with an attached a carbon nanotube (CNT), we simulated dielectrophoresis, which is caused by a non-uniform electric field. We calculated both the electric field and the fluid field in the area between the tip and the electrode below the tip. On the basis of these results, we analyzed the dielectrophoretic force and torque of CNTs dispersed in a fluid. We determined the ideal assembly conditions for achieving a high success rate. Based on the simulation results, then we were able to directly assemble only one of multi walled carbon nanotubes (MWNTs) that were dispersed in the diluted solution on the apex of the AFM tip. We achieved 50% success rate to fabricate CNT tips, and we show how the CNT tip compares with a conventional silicon tip with respect to the imaging of 15 nm gold particles.

Original languageEnglish
Title of host publication2005 5th IEEE Conference on Nanotechnology
Pages149-152
Number of pages4
Publication statusPublished - 2005
Externally publishedYes
Event2005 5th IEEE Conference on Nanotechnology - Nagoya, Japan
Duration: 2005 Jul 112005 Jul 15

Publication series

Name2005 5th IEEE Conference on Nanotechnology
Volume2

Other

Other2005 5th IEEE Conference on Nanotechnology
CountryJapan
CityNagoya
Period05/7/1105/7/15

Keywords

  • AFM
  • Carbon nanotube
  • Dielectrophoresis
  • Multi-physics simulation
  • Non-uniform electric field

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Han, C. S., Park, J. K., Kim, J. E., & Lee, E. S. (2005). Controlled assembly of carbon nanotube tip for AFM: Simulation & experiment. In 2005 5th IEEE Conference on Nanotechnology (pp. 149-152). [1500673] (2005 5th IEEE Conference on Nanotechnology; Vol. 2).