Controlled fabrication of gallium nitride nano- and micro-wires by dielectrophoretic force and torque

Jaehui Ahn, Geunwoo Ko, Ji Hyun Kim, Michael A. Mastro, Jennifer Hite, Charles R. Eddy

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

This paper demonstrates the manipulation of neutral dielectric wires with high aspect ratio by a pulsed electric field. Dielectrophoretic (DEP) force and torque were employed to align the randomly positioned GaN nano- and micro-wires. A simulation of the DEP force alignment process confirmed the experimentally observed dependence on alignment yield to frequency and bias of the electric field. Current-voltage measurements of the GaN micro-wires, aligned by DEP force and torque to pre-patterned metal contacts, confirms that the direct manipulation of micro-sized wire with an electric field oscillated at a frequency of 10 kHz-5 MHz.

Original languageEnglish
Pages (from-to)703-707
Number of pages5
JournalCurrent Applied Physics
Volume10
Issue number2
DOIs
Publication statusPublished - 2010 Mar 1

Fingerprint

Gallium nitride
gallium nitrides
torque
Torque
wire
Wire
Fabrication
fabrication
Electric fields
electric fields
manipulators
alignment
Voltage measurement
Electric current measurement
high aspect ratio
electrical measurement
Aspect ratio
electric contacts
Metals
gallium nitride

Keywords

  • Alignment
  • Electric field
  • GaN
  • Nanowire

ASJC Scopus subject areas

  • Materials Science(all)
  • Physics and Astronomy(all)

Cite this

Controlled fabrication of gallium nitride nano- and micro-wires by dielectrophoretic force and torque. / Ahn, Jaehui; Ko, Geunwoo; Kim, Ji Hyun; Mastro, Michael A.; Hite, Jennifer; Eddy, Charles R.

In: Current Applied Physics, Vol. 10, No. 2, 01.03.2010, p. 703-707.

Research output: Contribution to journalArticle

Ahn, Jaehui ; Ko, Geunwoo ; Kim, Ji Hyun ; Mastro, Michael A. ; Hite, Jennifer ; Eddy, Charles R. / Controlled fabrication of gallium nitride nano- and micro-wires by dielectrophoretic force and torque. In: Current Applied Physics. 2010 ; Vol. 10, No. 2. pp. 703-707.
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