@article{a538568c717f494cbd2ff22cc4f9cacb,
title = "Controlled modification of the morphology and structure of carbon nanotube probes using a focused ion beam",
keywords = "Atomic force microscopy, Carbon nanotube, Focused ion beam",
author = "Han, {C. S.} and Park, {J. K.} and Yoon, {Y. H.} and Shin, {Y. H.}",
note = "Funding Information: This work was supported by the Center for Nano Mechatronics and Manufacturing (CNMM) in Korea. The authors thank NNFC in Korea for FIB work and G.-H. Lee in Pohang University for AAO template.",
year = "2006",
month = dec,
doi = "10.1016/j.carbon.2006.06.017",
language = "English",
volume = "44",
pages = "3375--3378",
journal = "Carbon",
issn = "0008-6223",
publisher = "Elsevier Limited",
number = "15",
}