Current insertion transient response for measuring phase margin in negative feedback system

Bong No Yoon, Seung Woo Yu, Man Young Sung

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a current insertion transient method which can be applied to determine the system stability. Mathematical consideration is described which shows relationship between phase margin and stability. Total gain 93dB operational amplifier (Op Amp) is designed in order to apply the proposed transient response. A analog circuit designer may easily investigate his or her own system's fitness with this method.

Original languageEnglish
Title of host publicationIEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007
Pages377-380
Number of pages4
DOIs
Publication statusPublished - 2007 Dec 1
EventIEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007 - Tainan, Taiwan, Province of China
Duration: 2007 Dec 202007 Dec 22

Other

OtherIEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007
CountryTaiwan, Province of China
CityTainan
Period07/12/2007/12/22

Fingerprint

Operational amplifiers
Analog circuits
System stability
Transient analysis
Feedback

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Yoon, B. N., Yu, S. W., & Sung, M. Y. (2007). Current insertion transient response for measuring phase margin in negative feedback system. In IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007 (pp. 377-380). [4450141] https://doi.org/10.1109/EDSSC.2007.4450141

Current insertion transient response for measuring phase margin in negative feedback system. / Yoon, Bong No; Yu, Seung Woo; Sung, Man Young.

IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007. 2007. p. 377-380 4450141.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yoon, BN, Yu, SW & Sung, MY 2007, Current insertion transient response for measuring phase margin in negative feedback system. in IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007., 4450141, pp. 377-380, IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007, Tainan, Taiwan, Province of China, 07/12/20. https://doi.org/10.1109/EDSSC.2007.4450141
Yoon BN, Yu SW, Sung MY. Current insertion transient response for measuring phase margin in negative feedback system. In IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007. 2007. p. 377-380. 4450141 https://doi.org/10.1109/EDSSC.2007.4450141
Yoon, Bong No ; Yu, Seung Woo ; Sung, Man Young. / Current insertion transient response for measuring phase margin in negative feedback system. IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007. 2007. pp. 377-380
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