DeCUVE: Deep Learning Cloud Unified Virtual Environment

Bo Seon Kang, Chang-Sung Jeong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Recently, with advancement in deep learning technology in CCTV, drone and other various fields, large scale image processing environment becomes crucial and essential for fast real-time processing. In this paper, we shall present a distributed processing environment DeCUVE(Deep Learning Cloud Unified Virtual Environment) which provides scalability and provisioning for the deep learning inference. We shall show that deep learning training inference can be executed fast on our environment.

Original languageEnglish
Title of host publicationProceedings - 2017 International Conference on Computational Science and Computational Intelligence, CSCI 2017
EditorsFernando G. Tinetti, Quoc-Nam Tran, Leonidas Deligiannidis, Mary Qu Yang, Mary Qu Yang, Hamid R. Arabnia
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages836-839
Number of pages4
ISBN (Electronic)9781538626528
DOIs
Publication statusPublished - 2018 Dec 4
Event2017 International Conference on Computational Science and Computational Intelligence, CSCI 2017 - Las Vegas, United States
Duration: 2017 Dec 142017 Dec 16

Other

Other2017 International Conference on Computational Science and Computational Intelligence, CSCI 2017
CountryUnited States
CityLas Vegas
Period17/12/1417/12/16

Keywords

  • Deep learning
  • Distributed Environment
  • Image Processing

ASJC Scopus subject areas

  • Computer Science (miscellaneous)
  • Artificial Intelligence
  • Computer Networks and Communications
  • Computer Science Applications
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Kang, B. S., & Jeong, C-S. (2018). DeCUVE: Deep Learning Cloud Unified Virtual Environment. In F. G. Tinetti, Q-N. Tran, L. Deligiannidis, M. Q. Yang, M. Q. Yang, & H. R. Arabnia (Eds.), Proceedings - 2017 International Conference on Computational Science and Computational Intelligence, CSCI 2017 (pp. 836-839). [8560904] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CSCI.2017.145