Defect-free nanoporous thin films from ABC triblock copolymers

Joona Bang, Seung Hyun Kim, Eric Drockenmuller, Matthew J. Misner, Thomas P. Russell, Craig J. Hawker

Research output: Contribution to journalArticle

243 Citations (Scopus)

Abstract

The self-assembly of triblock copolymers of poly(ethylene oxide-b-methyl methacrylate-b-styrene) (PEO-b-PMMA-b-PS), where PS is the major component and PMMA and PEO are minor components, provides a robust route to highly ordered, nanoporous arrays with cylindrical pores of 10-15 nm that show promise in block copolymer lithography. These ABC triblock copolymers were synthesized by controlled living radical polymerization, and after solvent annealing, thin films showing defect-free cylindrical microdomains were obtained. The key to the successful generation of highly regular, porous thin films is the use of PMMA as a photodegradable mid-block which leads to nanoporous structures with an unprecedented degree of lateral order. The power of using a triblock copolymer when compared to a traditional diblock copolymer is evidenced by the ability to exploit and combine the advantages of two separate diblock copolymer systems, the high degree of lateral ordering inherent in PS-b-PEO diblocks plus the facile degradability of PS-b-PMMA diblock copolymer systems, while negating the corresponding disadvantages, poor degradability in PS-b-PEO systems and no long-range order for PS-b-PMMA diblocks.

Original languageEnglish
Pages (from-to)7622-7629
Number of pages8
JournalJournal of the American Chemical Society
Volume128
Issue number23
DOIs
Publication statusPublished - 2006 Jun 14

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Block copolymers
Polyethylene oxides
Polymethyl Methacrylate
Thin films
Defects
Ethylene Oxide
Styrene
Methacrylates
Polymerization
Living polymerization
Free radical polymerization
polystyrene-block-poly(methyl methacrylate)
Self assembly
Lithography
Annealing
polystyrene-b-poly(ethylene oxide)

ASJC Scopus subject areas

  • Chemistry(all)

Cite this

Bang, J., Kim, S. H., Drockenmuller, E., Misner, M. J., Russell, T. P., & Hawker, C. J. (2006). Defect-free nanoporous thin films from ABC triblock copolymers. Journal of the American Chemical Society, 128(23), 7622-7629. https://doi.org/10.1021/ja0608141

Defect-free nanoporous thin films from ABC triblock copolymers. / Bang, Joona; Kim, Seung Hyun; Drockenmuller, Eric; Misner, Matthew J.; Russell, Thomas P.; Hawker, Craig J.

In: Journal of the American Chemical Society, Vol. 128, No. 23, 14.06.2006, p. 7622-7629.

Research output: Contribution to journalArticle

Bang, J, Kim, SH, Drockenmuller, E, Misner, MJ, Russell, TP & Hawker, CJ 2006, 'Defect-free nanoporous thin films from ABC triblock copolymers', Journal of the American Chemical Society, vol. 128, no. 23, pp. 7622-7629. https://doi.org/10.1021/ja0608141
Bang J, Kim SH, Drockenmuller E, Misner MJ, Russell TP, Hawker CJ. Defect-free nanoporous thin films from ABC triblock copolymers. Journal of the American Chemical Society. 2006 Jun 14;128(23):7622-7629. https://doi.org/10.1021/ja0608141
Bang, Joona ; Kim, Seung Hyun ; Drockenmuller, Eric ; Misner, Matthew J. ; Russell, Thomas P. ; Hawker, Craig J. / Defect-free nanoporous thin films from ABC triblock copolymers. In: Journal of the American Chemical Society. 2006 ; Vol. 128, No. 23. pp. 7622-7629.
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