Defect states determining dynamic trapping-detrapping in β-Ga2O3 field-effect transistors

Alexander Y. Polyakov, Nikolai B. Smirnov, Ivan V. Shchemerov, Sergey V. Chernykh, Sooyeoun Oh, Stephen J. Pearton, Fan Ren, Anastasia Kochkova, Jihyun Kim

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