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Degradation-induced low frequency noise and deep traps in GaN/InGaN near-UV LEDs
In Hwan Lee, A. Y. Polyakov, Sung Min Hwang, N. M. Shmidt, E. I. Shabunina, N. A. Tal'Nishnih, N. B. Smirnov, I. V. Shchemerov, R. A. Zinovyev, S. A. Tarelkin, S. J. Pearton
Research output: Contribution to journal › Article › peer-review
18
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(Scopus)