Degradation mechanism of dielectric loss in barium niobate under a reducing atmosphere

Dong-Wan Kim, Byung Kook Kim, Hae June Je, Jae Gwan Park, Jeong Ryeol Kim, Kug Sun Hong

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

We developed multilayer ceramic capacitors (MLCCs) of the type negative-positive zero (NPO) cofired with Cu inner electrodes using novel low-loss barium niobates. The excellent dielectric properties of ceramics and compatibility between electrodes and dielectrics under a reducing atmosphere led to low loss character in the Cu-MLCCs, even in the high-frequency single-layer capacitors. We also examine the atmospheric dependence on dielectric loss of barium niobates. The origin of degradation in dielectric loss under a highly reducing atmosphere is explained by the association of two loss mechanisms: the oxygen vacancies in NbO6 octahedra and the subsequent formation of a reduced second phase: Ba3Nb 4+Nb45+O15.

Original languageEnglish
Pages (from-to)3302-3304
Number of pages3
JournalJournal of the American Ceramic Society
Volume89
Issue number10
DOIs
Publication statusPublished - 2006 Oct 1
Externally publishedYes

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Ceramic capacitors
barium
Barium
Dielectric losses
Multilayers
Degradation
degradation
Electrodes
atmosphere
ceramics
Oxygen vacancies
Dielectric properties
Capacitors
Association reactions
electrode
dielectric property
loss
oxygen

ASJC Scopus subject areas

  • Ceramics and Composites

Cite this

Degradation mechanism of dielectric loss in barium niobate under a reducing atmosphere. / Kim, Dong-Wan; Kim, Byung Kook; Je, Hae June; Park, Jae Gwan; Kim, Jeong Ryeol; Hong, Kug Sun.

In: Journal of the American Ceramic Society, Vol. 89, No. 10, 01.10.2006, p. 3302-3304.

Research output: Contribution to journalArticle

Kim, Dong-Wan ; Kim, Byung Kook ; Je, Hae June ; Park, Jae Gwan ; Kim, Jeong Ryeol ; Hong, Kug Sun. / Degradation mechanism of dielectric loss in barium niobate under a reducing atmosphere. In: Journal of the American Ceramic Society. 2006 ; Vol. 89, No. 10. pp. 3302-3304.
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