Degradation pattern of black phosphorus multilayer field−effect transistors in ambient conditions: Strategy for contact resistance engineering in BP transistors

Byung Chul Lee, Chul Min Kim, Ho Kyun Jang, Jae Woo Lee, Min Kyu Joo, Gyu-Tae Kim

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

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Engineering & Materials Science

Chemical Compounds