Degrees-of-freedom of the K-user MISO interference channel with delayed local CSIT

Chenxi Hao, Bruno Clercks

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Abstract

This paper considers a K-user Multiple-Input-Single-Output (MISO) Interference Channel (IC), where the channel state information obtained by the transmitters (CSIT) is perfect, but completely outdated. A Retrospective Interference Alignment (RIA) using such delayed CSIT was proposed by Maddah-Ali et. al for the MISO Broadcast Channel (BC), but the extension to the MISO IC is a non-trivial step as each transmitter only has the message intended for the corresponding user. Recently, Abdoli et.al focused on a Single-Input-Single-Output (SISO) IC and solved such bottleneck by inventing a distributed higher order symbol generation. Our main work is to extend Abdoli's work to the MISO case by integrating some features of Maddah-Ali's scheme. The achieved sum Degrees-of-Freedom (DoF) performance is asymptotically given by 64/15 when K→∞, outperforming all the previously known results.

Original languageEnglish
Title of host publication2015 IEEE International Conference on Communications, ICC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages4217-4222
Number of pages6
Volume2015-September
ISBN (Electronic)9781467364324
DOIs
Publication statusPublished - 2015 Sep 9
EventIEEE International Conference on Communications, ICC 2015 - London, United Kingdom
Duration: 2015 Jun 82015 Jun 12

Other

OtherIEEE International Conference on Communications, ICC 2015
CountryUnited Kingdom
CityLondon
Period15/6/815/6/12

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computer Networks and Communications

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  • Cite this

    Hao, C., & Clercks, B. (2015). Degrees-of-freedom of the K-user MISO interference channel with delayed local CSIT. In 2015 IEEE International Conference on Communications, ICC 2015 (Vol. 2015-September, pp. 4217-4222). [7248985] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICC.2015.7248985