Dependence of optical and electrical properties on Ag thickness in TiO2/Ag/TiO2 multilayer films for photovoltaic devices

Jun Ho Kim, Han Kyeol Lee, Jin Young Na, Sun Kyung Kim, Young Zo Yoo, Tae Yeon Seong

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

We report on the formation of highly transparent and low conductance TiO2/Ag/TiO2 multilayer films with high figure of merit (FOM). The optical and electrical properties of the multilayer films were investigated as a function of Ag layer thickness. As the Ag thickness increased, the transmission window narrowed and the transmittance was gradually lowered. The TiO2/Ag/TiO2 multilayer films have the highest transmittance of 86.3-97% at 591 nm for different Ag thicknesses. The relationship between transmittance and TiO2 thickness was simulated using the scattering matrix method to understand the abnormally high transmittance. As the Ag thickness increased from 15 to 25 nm, the carrier concentration of the TiO2/Ag/TiO2 samples gradually increased from 6.18×1021 to 1.07×1022 cm-3 and the mobility also increased from 16.7 to 25.2 cm2/V-s. Meanwhile, the sheet resistance slightly decreased from 6.17 to 2.27 Ω⧺q with the Ag thickness. The TiO2/Ag/TiO2 multilayer (with Ag thicknesses of 17-21 nm) had Haacke's FOMs of 121×10-3-157.2×10-3 Ω-1.

Original languageEnglish
Pages (from-to)8059-8063
Number of pages5
JournalCeramics International
Volume41
Issue number6
DOIs
Publication statusPublished - 2015 Jul 1

Fingerprint

Multilayer films
Electric properties
Optical properties
Sheet resistance
Carrier concentration
Multilayers
Scattering

Keywords

  • Ag
  • D. TiO
  • Multilayer
  • Transparent conducting electrode

ASJC Scopus subject areas

  • Ceramics and Composites
  • Process Chemistry and Technology
  • Electronic, Optical and Magnetic Materials
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

Dependence of optical and electrical properties on Ag thickness in TiO2/Ag/TiO2 multilayer films for photovoltaic devices. / Kim, Jun Ho; Lee, Han Kyeol; Na, Jin Young; Kim, Sun Kyung; Yoo, Young Zo; Seong, Tae Yeon.

In: Ceramics International, Vol. 41, No. 6, 01.07.2015, p. 8059-8063.

Research output: Contribution to journalArticle

Kim, Jun Ho ; Lee, Han Kyeol ; Na, Jin Young ; Kim, Sun Kyung ; Yoo, Young Zo ; Seong, Tae Yeon. / Dependence of optical and electrical properties on Ag thickness in TiO2/Ag/TiO2 multilayer films for photovoltaic devices. In: Ceramics International. 2015 ; Vol. 41, No. 6. pp. 8059-8063.
@article{f70ce4f3a1754860a6410b2f8ea5c137,
title = "Dependence of optical and electrical properties on Ag thickness in TiO2/Ag/TiO2 multilayer films for photovoltaic devices",
abstract = "We report on the formation of highly transparent and low conductance TiO2/Ag/TiO2 multilayer films with high figure of merit (FOM). The optical and electrical properties of the multilayer films were investigated as a function of Ag layer thickness. As the Ag thickness increased, the transmission window narrowed and the transmittance was gradually lowered. The TiO2/Ag/TiO2 multilayer films have the highest transmittance of 86.3-97{\%} at 591 nm for different Ag thicknesses. The relationship between transmittance and TiO2 thickness was simulated using the scattering matrix method to understand the abnormally high transmittance. As the Ag thickness increased from 15 to 25 nm, the carrier concentration of the TiO2/Ag/TiO2 samples gradually increased from 6.18×1021 to 1.07×1022 cm-3 and the mobility also increased from 16.7 to 25.2 cm2/V-s. Meanwhile, the sheet resistance slightly decreased from 6.17 to 2.27 Ω{\^a}§şq with the Ag thickness. The TiO2/Ag/TiO2 multilayer (with Ag thicknesses of 17-21 nm) had Haacke's FOMs of 121×10-3-157.2×10-3 Ω-1.",
keywords = "Ag, D. TiO, Multilayer, Transparent conducting electrode",
author = "Kim, {Jun Ho} and Lee, {Han Kyeol} and Na, {Jin Young} and Kim, {Sun Kyung} and Yoo, {Young Zo} and Seong, {Tae Yeon}",
year = "2015",
month = "7",
day = "1",
doi = "10.1016/j.ceramint.2015.03.002",
language = "English",
volume = "41",
pages = "8059--8063",
journal = "Ceramics International",
issn = "0272-8842",
publisher = "Elsevier Limited",
number = "6",

}

TY - JOUR

T1 - Dependence of optical and electrical properties on Ag thickness in TiO2/Ag/TiO2 multilayer films for photovoltaic devices

AU - Kim, Jun Ho

AU - Lee, Han Kyeol

AU - Na, Jin Young

AU - Kim, Sun Kyung

AU - Yoo, Young Zo

AU - Seong, Tae Yeon

PY - 2015/7/1

Y1 - 2015/7/1

N2 - We report on the formation of highly transparent and low conductance TiO2/Ag/TiO2 multilayer films with high figure of merit (FOM). The optical and electrical properties of the multilayer films were investigated as a function of Ag layer thickness. As the Ag thickness increased, the transmission window narrowed and the transmittance was gradually lowered. The TiO2/Ag/TiO2 multilayer films have the highest transmittance of 86.3-97% at 591 nm for different Ag thicknesses. The relationship between transmittance and TiO2 thickness was simulated using the scattering matrix method to understand the abnormally high transmittance. As the Ag thickness increased from 15 to 25 nm, the carrier concentration of the TiO2/Ag/TiO2 samples gradually increased from 6.18×1021 to 1.07×1022 cm-3 and the mobility also increased from 16.7 to 25.2 cm2/V-s. Meanwhile, the sheet resistance slightly decreased from 6.17 to 2.27 Ω⧺q with the Ag thickness. The TiO2/Ag/TiO2 multilayer (with Ag thicknesses of 17-21 nm) had Haacke's FOMs of 121×10-3-157.2×10-3 Ω-1.

AB - We report on the formation of highly transparent and low conductance TiO2/Ag/TiO2 multilayer films with high figure of merit (FOM). The optical and electrical properties of the multilayer films were investigated as a function of Ag layer thickness. As the Ag thickness increased, the transmission window narrowed and the transmittance was gradually lowered. The TiO2/Ag/TiO2 multilayer films have the highest transmittance of 86.3-97% at 591 nm for different Ag thicknesses. The relationship between transmittance and TiO2 thickness was simulated using the scattering matrix method to understand the abnormally high transmittance. As the Ag thickness increased from 15 to 25 nm, the carrier concentration of the TiO2/Ag/TiO2 samples gradually increased from 6.18×1021 to 1.07×1022 cm-3 and the mobility also increased from 16.7 to 25.2 cm2/V-s. Meanwhile, the sheet resistance slightly decreased from 6.17 to 2.27 Ω⧺q with the Ag thickness. The TiO2/Ag/TiO2 multilayer (with Ag thicknesses of 17-21 nm) had Haacke's FOMs of 121×10-3-157.2×10-3 Ω-1.

KW - Ag

KW - D. TiO

KW - Multilayer

KW - Transparent conducting electrode

UR - http://www.scopus.com/inward/record.url?scp=84927574846&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84927574846&partnerID=8YFLogxK

U2 - 10.1016/j.ceramint.2015.03.002

DO - 10.1016/j.ceramint.2015.03.002

M3 - Article

VL - 41

SP - 8059

EP - 8063

JO - Ceramics International

JF - Ceramics International

SN - 0272-8842

IS - 6

ER -