Dependence of Q factor on surface roughness in a plasmonic cavity

Yoon Ho Kim, Soon Hong Kwon, Ho Seok Ee, Yongsop Hwang, You Shin No, Hong Kyu Park

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

We investigated surface-roughness-dependent optical loss in a plasmonic cavity consisting of a semiconductor nanodisk/silver nanopan structure. Numerical simulations show that the quality factors of plasmonic resonant modes significantly depend on the surface roughness of the dielectric-metal interface in the cavity structure. In the transverse-magnetic-like whispering-gallery plasmonic mode excited in a structure with disk diameter of 1000 nm, the total quality factor decreased from 260 to 130 with increasing root-mean-square (rms) surface roughness from 0 to 5 nm. This quantitative theoretical study shows that the smooth metal surface plays a critical role in high-performance plasmonic devices.

Original languageEnglish
Pages (from-to)188-191
Number of pages4
JournalJournal of the Optical Society of Korea
Volume20
Issue number1
DOIs
Publication statusPublished - 2016 Feb 1

Keywords

  • Finite-difference time-domain simulations
  • Plasmonic cavities
  • Surface plasmon polaritons
  • Surface roughness

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Fingerprint Dive into the research topics of 'Dependence of Q factor on surface roughness in a plasmonic cavity'. Together they form a unique fingerprint.

  • Cite this