Detail restoration and tone mapping networks for X-ray security inspection

Hyo Young Kim, Seung Park, Yong Goo Shin, Seung Won Jung, Sung Jea Ko

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

X-ray imaging is one of the most widely used security measures for maintaining airport and transportation security. Conventional X-ray imaging systems typically apply tone-mapping (TM) algorithms to visualize high-dynamic-range (HDR) X-ray images on a standard 8-bit display device. However, X-ray images obtained through traditional TM algorithms often suffer from halo artifacts or detail loss in interobject overlapping regions, which makes it difficult for an inspector to detect unsafe or hazardous objects. To alleviate these problems, this article proposes a deep learning-based TM method for X-ray inspection. The proposed method consists of two networks called detail-recovery network (DR-Net) and TM network (TM-Net). The goal of DR-Net is to restore the details in the input HDR image, whereas TM-Net aims to compress the dynamic range while preserving the restored details and preventing halo artifacts. Since there are no standard ground-truth images available for the TM of X-ray images, we propose a novel loss function for unsupervised learning of TM-Net. We also introduce a dataset synthesis technique using the Beer-Lambert law for supervised learning of DR-Net. Extensive experiments comparing the performance of our proposed method with state-of-the-art TM methods demonstrate that the proposed method not only achieves visually compelling results but also improves the quantitative performance measures such as FSITM and HDR-VDP-2.2.

Original languageEnglish
Pages (from-to)197473-197483
Number of pages11
JournalIEEE Access
Volume8
DOIs
Publication statusPublished - 2020

Keywords

  • Convolutional neural network
  • High dynamic range
  • Tone mapping
  • Unsupervised learning
  • X-ray imaging

ASJC Scopus subject areas

  • Computer Science(all)
  • Materials Science(all)
  • Engineering(all)

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