Detecting trapdoors in smart cards using timing and power analysis

Jung Youp Lee, Seok Won Jung, Jongin Lim

Research output: Contribution to journalConference articlepeer-review

3 Citations (Scopus)

Abstract

For economic reasons, in spite of security problems, the commands of re-initializing the card and writing patch code are widely used in smart cards. The current software tester has difficulty in detecting these trapdoor commands by reason that trapdoors are not published and programmed sophisticatedly. Up to now the effective way to detect them is to completely reveal and analyze the entire code of the COS with applications such as the ITSEC. It is, however, very time-consuming and expensive processes. We propose a new approach of detecting trapdoors in smart cards using timing and power analysis. By experiments, this paper shows that this approach is a more practical method than the current methods.

Original languageEnglish
Pages (from-to)275-288
Number of pages14
JournalLecture Notes in Computer Science
Volume3502
DOIs
Publication statusPublished - 2005
Event17th IFIP TC6/WG 6.1 International Conference, TestCom 2005: Testing of Communicating Systems - Montreal, Que., Canada
Duration: 2005 May 312005 Jun 2

Keywords

  • Power Analysis
  • Smart Card
  • Timing Analysis
  • Trapdoor

ASJC Scopus subject areas

  • Theoretical Computer Science
  • Computer Science(all)

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