Detecting trapdoors in smart cards using timing and power analysis

Jung Youp Lee, Seok Won Jung, Jong In Lim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

For economic reasons, in spite of security problems, the commands of re-initializing the card and writing patch code are widely used in smart cards. The current software tester has difficulty in detecting these trapdoor commands by reason that trapdoors are not published and programmed sophisticatedly. Up to now the effective way to detect them is to completely reveal and analyze the entire code of the COS with applications such as the ITSEC. It is, however, very time-consuming and expensive processes. We propose a new approach of detecting trapdoors in smart cards using timing and power analysis. By experiments, this paper shows that this approach is a more practical method than the current methods.

Original languageEnglish
Title of host publicationLecture Notes in Computer Science
EditorsF. Khendek, R. Dssouli
Pages275-288
Number of pages14
Volume3502
Publication statusPublished - 2005
Event17th IFIP TC6/WG 6.1 International Conference, TestCom 2005: Testing of Communicating Systems - Montreal, Que., Canada
Duration: 2005 May 312005 Jun 2

Other

Other17th IFIP TC6/WG 6.1 International Conference, TestCom 2005: Testing of Communicating Systems
CountryCanada
CityMontreal, Que.
Period05/5/3105/6/2

Fingerprint

Smart cards
Economics
Experiments

Keywords

  • Power Analysis
  • Smart Card
  • Timing Analysis
  • Trapdoor

ASJC Scopus subject areas

  • Computer Science (miscellaneous)

Cite this

Lee, J. Y., Jung, S. W., & Lim, J. I. (2005). Detecting trapdoors in smart cards using timing and power analysis. In F. Khendek, & R. Dssouli (Eds.), Lecture Notes in Computer Science (Vol. 3502, pp. 275-288)

Detecting trapdoors in smart cards using timing and power analysis. / Lee, Jung Youp; Jung, Seok Won; Lim, Jong In.

Lecture Notes in Computer Science. ed. / F. Khendek; R. Dssouli. Vol. 3502 2005. p. 275-288.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Lee, JY, Jung, SW & Lim, JI 2005, Detecting trapdoors in smart cards using timing and power analysis. in F Khendek & R Dssouli (eds), Lecture Notes in Computer Science. vol. 3502, pp. 275-288, 17th IFIP TC6/WG 6.1 International Conference, TestCom 2005: Testing of Communicating Systems, Montreal, Que., Canada, 05/5/31.
Lee JY, Jung SW, Lim JI. Detecting trapdoors in smart cards using timing and power analysis. In Khendek F, Dssouli R, editors, Lecture Notes in Computer Science. Vol. 3502. 2005. p. 275-288
Lee, Jung Youp ; Jung, Seok Won ; Lim, Jong In. / Detecting trapdoors in smart cards using timing and power analysis. Lecture Notes in Computer Science. editor / F. Khendek ; R. Dssouli. Vol. 3502 2005. pp. 275-288
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