Detection and removal of long scratch lines in aged films

Timothy K. Shih, Louis H. Lin, Wonjun Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

16 Citations (Scopus)

Abstract

Historical films usually have defects. We study the type of defects, and propose a series of solutions to detect defects before they are repaired by our inpainting algorithms. This paper focuses on a difficult issue to locate long vertical line defects in aged films. A progressive detection algorithm is proposed. We are able to detect more than 86% (recall rate) of effective line defects. These line defects are then removed step by step. The experiments use real historical video collected from national museum and public channel, instead of using computer generated noise. The results are visually pleasant based on our subjective evaluation by volunteers.

Original languageEnglish
Title of host publication2006 IEEE International Conference on Multimedia and Expo, ICME 2006 - Proceedings
Pages477-480
Number of pages4
Volume2006
DOIs
Publication statusPublished - 2006 Dec 1
Event2006 IEEE International Conference on Multimedia and Expo, ICME 2006 - Toronto, ON, Canada
Duration: 2006 Jul 92006 Jul 12

Other

Other2006 IEEE International Conference on Multimedia and Expo, ICME 2006
CountryCanada
CityToronto, ON
Period06/7/906/7/12

Fingerprint

Defects
Museums
Experiments

ASJC Scopus subject areas

  • Media Technology
  • Electrical and Electronic Engineering

Cite this

Shih, T. K., Lin, L. H., & Lee, W. (2006). Detection and removal of long scratch lines in aged films. In 2006 IEEE International Conference on Multimedia and Expo, ICME 2006 - Proceedings (Vol. 2006, pp. 477-480). [4036640] https://doi.org/10.1109/ICME.2006.262576

Detection and removal of long scratch lines in aged films. / Shih, Timothy K.; Lin, Louis H.; Lee, Wonjun.

2006 IEEE International Conference on Multimedia and Expo, ICME 2006 - Proceedings. Vol. 2006 2006. p. 477-480 4036640.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Shih, TK, Lin, LH & Lee, W 2006, Detection and removal of long scratch lines in aged films. in 2006 IEEE International Conference on Multimedia and Expo, ICME 2006 - Proceedings. vol. 2006, 4036640, pp. 477-480, 2006 IEEE International Conference on Multimedia and Expo, ICME 2006, Toronto, ON, Canada, 06/7/9. https://doi.org/10.1109/ICME.2006.262576
Shih TK, Lin LH, Lee W. Detection and removal of long scratch lines in aged films. In 2006 IEEE International Conference on Multimedia and Expo, ICME 2006 - Proceedings. Vol. 2006. 2006. p. 477-480. 4036640 https://doi.org/10.1109/ICME.2006.262576
Shih, Timothy K. ; Lin, Louis H. ; Lee, Wonjun. / Detection and removal of long scratch lines in aged films. 2006 IEEE International Conference on Multimedia and Expo, ICME 2006 - Proceedings. Vol. 2006 2006. pp. 477-480
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