Detection and volume estimation of semiconductor quantum dots from atomic force microscope images

Sangwook Oh, Chankyeong Hyon, Sanghoon Sull, Sungwoo Hwang, Yongju Park

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The data from atomic force microscope images was analyzed for the detection and volume estimation of semiconductor quantum dots. The image-segmentation method was used for the quantum dot detection. The boundary of the quantum dot at each height step was determined for an effective volume estimation of the quantum dot. As the amount of the source material consumed could be predicted, the volume estimation was considered to be an important proceedure in the quantum dot growth.

Original languageEnglish
Pages (from-to)4687-4695
Number of pages9
JournalReview of Scientific Instruments
Volume74
Issue number11
DOIs
Publication statusPublished - 2003 Nov 1

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Semiconductor quantum dots
Microscopes
microscopes
quantum dots
Image segmentation

ASJC Scopus subject areas

  • Instrumentation
  • Physics and Astronomy (miscellaneous)

Cite this

Detection and volume estimation of semiconductor quantum dots from atomic force microscope images. / Oh, Sangwook; Hyon, Chankyeong; Sull, Sanghoon; Hwang, Sungwoo; Park, Yongju.

In: Review of Scientific Instruments, Vol. 74, No. 11, 01.11.2003, p. 4687-4695.

Research output: Contribution to journalArticle

Oh, Sangwook ; Hyon, Chankyeong ; Sull, Sanghoon ; Hwang, Sungwoo ; Park, Yongju. / Detection and volume estimation of semiconductor quantum dots from atomic force microscope images. In: Review of Scientific Instruments. 2003 ; Vol. 74, No. 11. pp. 4687-4695.
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