Detection of DC voltages in multi-layered magnetic thin films undergoing ferromagnetic resonance

E. R. Park, D. K. Oh, Cheol Eui Lee, S. H. Kim, Seong Rae Lee, Young-geun Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Detection of dc voltages in multi-layered magnetic thin films was discussed. Electron paramagnetic resonance (EPR) spectrometer was used. Results showed that detected dc voltage and ferromagnetic resonance (FMR) signals are coincidental and dc voltages are smaller than ∼10 μV.

Original languageEnglish
Title of host publicationDigests of the Intermag Conference
Publication statusPublished - 2002
Event2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
Duration: 2002 Apr 282002 May 2

Other

Other2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG
CountryNetherlands
CityAmsterdam
Period02/4/2802/5/2

Fingerprint

Magnetic thin films
Ferromagnetic resonance
Electric potential
Paramagnetic resonance
Spectrometers

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Detection of DC voltages in multi-layered magnetic thin films undergoing ferromagnetic resonance. / Park, E. R.; Oh, D. K.; Lee, Cheol Eui; Kim, S. H.; Lee, Seong Rae; Kim, Young-geun.

Digests of the Intermag Conference. 2002.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Park, ER, Oh, DK, Lee, CE, Kim, SH, Lee, SR & Kim, Y 2002, Detection of DC voltages in multi-layered magnetic thin films undergoing ferromagnetic resonance. in Digests of the Intermag Conference. 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG, Amsterdam, Netherlands, 02/4/28.
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AU - Kim, S. H.

AU - Lee, Seong Rae

AU - Kim, Young-geun

PY - 2002

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