Detector performance and defect densities in CdZnTe after two-step annealing

Eunhye Kim, Yonghoon Kim, A. E. Bolotnikov, R. B. James, Kihyun Kim

Research output: Contribution to journalArticle

Abstract

Defects both microscale and nanoscale are play an important role in CdZnTe (CZT) device performance. Typical micro-scale defects such as Te inclusions were removed via a two-step annealing process, and their concentration was analyzed via IR transmission microscopy. In addition, transmission electron microscopy (TEM) measurement was employed to investigate the evolution of nano-scale defects after the annealing process. Dislocation and stacking faults were commonly observed defects in as-grown and annealed CZT. The line shape defects, which are possibly related to the stress field around dislocations, disappeared during the in-situ the annealing at 200–220 °C. A Frisch-grid CZT detector made via the two-step annealing process exhibited improved energy resolution and low backscattering counts in Cs-137 gamma spectra.

Original languageEnglish
Pages (from-to)51-54
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume923
DOIs
Publication statusPublished - 2019 Apr 11

Fingerprint

Defect density
Annealing
Detectors
Defects
annealing
detectors
defects
Infrared transmission
Stacking faults
Backscattering
Dislocations (crystals)
crystal defects
microbalances
stress distribution
line shape
backscattering
Microscopic examination
grids
inclusions
Transmission electron microscopy

Keywords

  • Annealing
  • CdZnTe
  • Dislocation
  • Microscale defects
  • Nanoscale defects
  • Stacking fault

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

Detector performance and defect densities in CdZnTe after two-step annealing. / Kim, Eunhye; Kim, Yonghoon; Bolotnikov, A. E.; James, R. B.; Kim, Kihyun.

In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 923, 11.04.2019, p. 51-54.

Research output: Contribution to journalArticle

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