Development of 65-nm CMOS switch modulator for on-off keying communication systems at 300GHz

C. Yi, K. M. Lee, Moonil Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A on-off keying (OOK) communication system is fabricated using 65-nm CMOS technology for 300 GHz operation. The structure of OOK modulator is a double-shunt which have insertion loss of 7.7 dB and on-off ratio of 11.6 dB. And performance of the modulator is close agreement with the results predicted by advanced design system (ADS) with capacitor model calibration. And the envelope detector is common-gate and single-ended structure. The performance of OOK communication system which the modulator and envelope detector are combined have a bit error rate (BER) lower than 10-9 at 800 Mbps.

Original languageEnglish
Title of host publication2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages4670-4672
Number of pages3
ISBN (Electronic)9781509060931
DOIs
Publication statusPublished - 2016 Nov 3
Event2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Shanghai, China
Duration: 2016 Aug 82016 Aug 11

Publication series

Name2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings

Conference

Conference2016 Progress In Electromagnetics Research Symposium, PIERS 2016
CountryChina
CityShanghai
Period16/8/816/8/11

ASJC Scopus subject areas

  • Instrumentation
  • Radiation
  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

Fingerprint Dive into the research topics of 'Development of 65-nm CMOS switch modulator for on-off keying communication systems at 300GHz'. Together they form a unique fingerprint.

  • Cite this

    Yi, C., Lee, K. M., & Kim, M. (2016). Development of 65-nm CMOS switch modulator for on-off keying communication systems at 300GHz. In 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings (pp. 4670-4672). [7735718] (2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PIERS.2016.7735718