Development of a DAQ system for a plasma display panel-based X-ray detector (PXD)

Hakjae Lee, Young Jun Jung, Sangheum Eom, Jungwon Kang, Kisung Lee

Research output: Contribution to journalArticle

Abstract

Recently, a novel plasma display panel (PDP)-based X-ray detector (PXD) was developed. The goal of this study is to develop a data acquisition system for use with the PXD as an imaging detector. Since the prototype detector does not have any barrier ribs or a switching device in a detector pixel, a novel pixelation scheme - the line-scan method - is developed for this new detector. To implement line scanning, a multichannel high-voltage switching circuit and a multichannel charge-acquisition circuit are developed. These two circuits are controlled by an FPGA-based digital signal processing board, from which the information about the charge and position of each pixel can be sent to a PC. FPGA-based baseline compensation and switching noise rejection algorithms are used to improve the signal-to-noise ratio (SNR). The characteristic curve of the entire PXD system is acquired, and the correlation coefficients between the X-ray dose, and the signal intensity and the SNR were determined to be approximately 0.99 and 52.9, respectively.

Original languageEnglish
Pages (from-to)213-219
Number of pages7
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume784
DOIs
Publication statusPublished - 2015 Jun 1

Fingerprint

Detectors
Plasmas
X rays
detectors
x rays
Field programmable gate arrays (FPGA)
Signal to noise ratio
signal to noise ratios
Pixels
pixels
Switching circuits
switching circuits
Networks (circuits)
Digital signal processing
correlation coefficients
rejection
Dosimetry
data acquisition
signal processing
high voltages

Keywords

  • DAQ
  • FPGA
  • Imaging
  • PXD

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

Cite this

Development of a DAQ system for a plasma display panel-based X-ray detector (PXD). / Lee, Hakjae; Jung, Young Jun; Eom, Sangheum; Kang, Jungwon; Lee, Kisung.

In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 784, 01.06.2015, p. 213-219.

Research output: Contribution to journalArticle

@article{626a65ee86a84c7baec2e7abe207d0ca,
title = "Development of a DAQ system for a plasma display panel-based X-ray detector (PXD)",
abstract = "Recently, a novel plasma display panel (PDP)-based X-ray detector (PXD) was developed. The goal of this study is to develop a data acquisition system for use with the PXD as an imaging detector. Since the prototype detector does not have any barrier ribs or a switching device in a detector pixel, a novel pixelation scheme - the line-scan method - is developed for this new detector. To implement line scanning, a multichannel high-voltage switching circuit and a multichannel charge-acquisition circuit are developed. These two circuits are controlled by an FPGA-based digital signal processing board, from which the information about the charge and position of each pixel can be sent to a PC. FPGA-based baseline compensation and switching noise rejection algorithms are used to improve the signal-to-noise ratio (SNR). The characteristic curve of the entire PXD system is acquired, and the correlation coefficients between the X-ray dose, and the signal intensity and the SNR were determined to be approximately 0.99 and 52.9, respectively.",
keywords = "DAQ, FPGA, Imaging, PXD",
author = "Hakjae Lee and Jung, {Young Jun} and Sangheum Eom and Jungwon Kang and Kisung Lee",
year = "2015",
month = "6",
day = "1",
doi = "10.1016/j.nima.2014.11.043",
language = "English",
volume = "784",
pages = "213--219",
journal = "Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment",
issn = "0168-9002",
publisher = "Elsevier",

}

TY - JOUR

T1 - Development of a DAQ system for a plasma display panel-based X-ray detector (PXD)

AU - Lee, Hakjae

AU - Jung, Young Jun

AU - Eom, Sangheum

AU - Kang, Jungwon

AU - Lee, Kisung

PY - 2015/6/1

Y1 - 2015/6/1

N2 - Recently, a novel plasma display panel (PDP)-based X-ray detector (PXD) was developed. The goal of this study is to develop a data acquisition system for use with the PXD as an imaging detector. Since the prototype detector does not have any barrier ribs or a switching device in a detector pixel, a novel pixelation scheme - the line-scan method - is developed for this new detector. To implement line scanning, a multichannel high-voltage switching circuit and a multichannel charge-acquisition circuit are developed. These two circuits are controlled by an FPGA-based digital signal processing board, from which the information about the charge and position of each pixel can be sent to a PC. FPGA-based baseline compensation and switching noise rejection algorithms are used to improve the signal-to-noise ratio (SNR). The characteristic curve of the entire PXD system is acquired, and the correlation coefficients between the X-ray dose, and the signal intensity and the SNR were determined to be approximately 0.99 and 52.9, respectively.

AB - Recently, a novel plasma display panel (PDP)-based X-ray detector (PXD) was developed. The goal of this study is to develop a data acquisition system for use with the PXD as an imaging detector. Since the prototype detector does not have any barrier ribs or a switching device in a detector pixel, a novel pixelation scheme - the line-scan method - is developed for this new detector. To implement line scanning, a multichannel high-voltage switching circuit and a multichannel charge-acquisition circuit are developed. These two circuits are controlled by an FPGA-based digital signal processing board, from which the information about the charge and position of each pixel can be sent to a PC. FPGA-based baseline compensation and switching noise rejection algorithms are used to improve the signal-to-noise ratio (SNR). The characteristic curve of the entire PXD system is acquired, and the correlation coefficients between the X-ray dose, and the signal intensity and the SNR were determined to be approximately 0.99 and 52.9, respectively.

KW - DAQ

KW - FPGA

KW - Imaging

KW - PXD

UR - http://www.scopus.com/inward/record.url?scp=84928594330&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84928594330&partnerID=8YFLogxK

U2 - 10.1016/j.nima.2014.11.043

DO - 10.1016/j.nima.2014.11.043

M3 - Article

VL - 784

SP - 213

EP - 219

JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

SN - 0168-9002

ER -