Development of a lens-coupled CMOS detector for an X-ray inspection system

Ho Kyung Kim, Jung Keun Ahn, Gyuseong Cho

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

A digital X-ray imaging detector based on a complementary metal-oxide-semiconductor (CMOS) image sensor has been developed for X-ray non-destructive inspection applications. This is a cost-effective solution because of the availability of cheap commercial standard CMOS image sensors. The detector configuration adopts an indirect X-ray detection method by using scintillation material and lens assembly. As a feasibility test of the developed lens-coupled CMOS detector as an X-ray inspection system, we have acquired X-ray projection images under a variety of imaging conditions. The results show that the projected image is reasonably acceptable in typical non-destructive testing (NDT). However, the developed detector may not be appropriate for laminography due to a low light-collection efficiency of lens assembly. In this paper, construction of the lens-coupled CMOS detector and its specifications are described, and the experimental results are presented. Using the analysis of quantum accounting diagram, inefficiency of the lens-coupling method is discussed.

Original languageEnglish
Pages (from-to)210-216
Number of pages7
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume545
Issue number1-2
DOIs
Publication statusPublished - 2005 Jun 11
Externally publishedYes

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Keywords

  • CMOS
  • Laminography
  • Lens coupling efficiency
  • NDT
  • Quantum accounting diagram
  • X-ray imaging

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

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