Abstract
Grain growth in the cold rolled and subsequently recrystallized AA 5182 sheets was investigated by means of microstructure observations and texture measurements. Grain growth behavior strongly depends on the annealing temperatures. Grain growth hardly took place at temperatures lower than 470°C, which is attributed to a low mobility of grain boundaries. Abnormal grain growth occurred at temperatures ranging from 480 to 530°C Annealing above 560°C gave rise to the dissolution of inhibitor precipitates, which led to normal grain growth.
| Original language | English |
|---|---|
| Title of host publication | Diffusion and Defect Data Pt.B: Solid State Phenomena |
| Pages | 316-319 |
| Number of pages | 4 |
| Volume | 116-117 |
| Publication status | Published - 2006 Dec 1 |
| Event | 9th International Conference on Semi-Solid Processing of Alloys and Composites, S2P 2006 - Busan, Korea, Republic of Duration: 2006 Sep 11 → 2006 Sep 13 |
Publication series
| Name | Diffusion and Defect Data Pt.B: Solid State Phenomena |
|---|---|
| Volume | 116-117 |
| ISSN (Print) | 10120394 |
Other
| Other | 9th International Conference on Semi-Solid Processing of Alloys and Composites, S2P 2006 |
|---|---|
| Country | Korea, Republic of |
| City | Busan |
| Period | 06/9/11 → 06/9/13 |
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Keywords
- Abnormal grain growth
- Normal grain growth
- Recrystallization
- Texture
ASJC Scopus subject areas
- Materials Science(all)
- Physics and Astronomy (miscellaneous)
- Condensed Matter Physics
- Electronic, Optical and Magnetic Materials
Cite this
Development of abnormal grain growth in cold rolled and recrystallized AA 5182 sheet. / Suk, H. G.; Shin, E. J.; Huh, Moo Young.
Diffusion and Defect Data Pt.B: Solid State Phenomena. Vol. 116-117 2006. p. 316-319 (Diffusion and Defect Data Pt.B: Solid State Phenomena; Vol. 116-117).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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TY - GEN
T1 - Development of abnormal grain growth in cold rolled and recrystallized AA 5182 sheet
AU - Suk, H. G.
AU - Shin, E. J.
AU - Huh, Moo Young
PY - 2006/12/1
Y1 - 2006/12/1
N2 - Grain growth in the cold rolled and subsequently recrystallized AA 5182 sheets was investigated by means of microstructure observations and texture measurements. Grain growth behavior strongly depends on the annealing temperatures. Grain growth hardly took place at temperatures lower than 470°C, which is attributed to a low mobility of grain boundaries. Abnormal grain growth occurred at temperatures ranging from 480 to 530°C Annealing above 560°C gave rise to the dissolution of inhibitor precipitates, which led to normal grain growth.
AB - Grain growth in the cold rolled and subsequently recrystallized AA 5182 sheets was investigated by means of microstructure observations and texture measurements. Grain growth behavior strongly depends on the annealing temperatures. Grain growth hardly took place at temperatures lower than 470°C, which is attributed to a low mobility of grain boundaries. Abnormal grain growth occurred at temperatures ranging from 480 to 530°C Annealing above 560°C gave rise to the dissolution of inhibitor precipitates, which led to normal grain growth.
KW - Abnormal grain growth
KW - Normal grain growth
KW - Recrystallization
KW - Texture
UR - http://www.scopus.com/inward/record.url?scp=34249914999&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34249914999&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:34249914999
SN - 3908451264
SN - 9783908451266
VL - 116-117
T3 - Diffusion and Defect Data Pt.B: Solid State Phenomena
SP - 316
EP - 319
BT - Diffusion and Defect Data Pt.B: Solid State Phenomena
ER -