Development of polycide application and control of process conditions on DCS based WSix

Young Kyou Park, Jaihyung Won, Ju Hwan Park, Jung ho Park

Research output: Contribution to journalConference article

Abstract

Dichlorosilane based CVD WSix is deposited by the reaction of tungsten fluoride (WF6) and dichlorosilane (SiH2Cl2; DCS). The reaction is thermodynamically favorable and results in WSix film with less fluorine (F) concentration than monosilane (SiH4; MS) based WSix. DCS based WSix shows less expansion of gate oxide and better step coverage than monosilane based WSix. Due to its DCS based stable film stoichiometry, WSix has low resistivity and therefore has been widely applied in ULSI memory devices. However, DCS is a source of chlorine, which is a major impurity. This means special considerations have to be made when using DCS based WSix in comparison with MS based WSix. This work provides evaluation and control of chlorine behaviors in DCS based WSix film.

Original languageEnglish
JournalMaterials Research Society Symposium - Proceedings
Volume670
Publication statusPublished - 2001 Dec 1
EventGate Stack and Silicide Issues in Silicon Processing II - San Francisco, CA, United States
Duration: 2001 Apr 172001 Apr 19

Fingerprint

Chlorine
tungsten fluorides
chlorine
Tungsten
Fluorine
Fluorides
Stoichiometry
Oxides
fluorine
stoichiometry
Chemical vapor deposition
vapor deposition
Impurities
Data storage equipment
impurities
electrical resistivity
expansion
oxides
evaluation
dichlorosilane

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Development of polycide application and control of process conditions on DCS based WSix. / Park, Young Kyou; Won, Jaihyung; Park, Ju Hwan; Park, Jung ho.

In: Materials Research Society Symposium - Proceedings, Vol. 670, 01.12.2001.

Research output: Contribution to journalConference article

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