Dielectrophoretically formed single wall carbon nanotube network on polyether sulfone

Tae Geun Kim, J. S. Hwang, J. Kang, Sangsig Kim, S. Roth, U. Dettlaff-Weglikowska, S. W. Hwang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

AC dielectrophoresis (DEP) is a useful method to fabricate single wall carbon nanotube (SWCNT) network structures on various kinds of substrates. We report on the fabrication of SWCNT networks with varying densities, on transparent and flexible polyether sulfone (PES) substrates by using DEP. From the scanning electron microscope observations and current-voltage measurements of the fabricated SWCNT network, we obtain the contour map of the density and conductance as functions of V p-p and f. Our results show that the maximum density does not necessarily imply the maximum conductance. We find that there exists an optimum density for the maximum conductance.

Original languageEnglish
Title of host publicationAIP Conference Proceedings
Pages765-766
Number of pages2
Volume1399
DOIs
Publication statusPublished - 2011 Dec 1
Event30th International Conference on the Physics of Semiconductors, ICPS-30 - Seoul, Korea, Republic of
Duration: 2010 Jul 252010 Jul 30

Other

Other30th International Conference on the Physics of Semiconductors, ICPS-30
CountryKorea, Republic of
CitySeoul
Period10/7/2510/7/30

Fingerprint

sulfones
carbon nanotubes
electrical measurement
alternating current
electron microscopes
fabrication
scanning

Keywords

  • dielectrophoresis
  • flexible substrate
  • network
  • Single-wall carbon nanotube

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Kim, T. G., Hwang, J. S., Kang, J., Kim, S., Roth, S., Dettlaff-Weglikowska, U., & Hwang, S. W. (2011). Dielectrophoretically formed single wall carbon nanotube network on polyether sulfone. In AIP Conference Proceedings (Vol. 1399, pp. 765-766) https://doi.org/10.1063/1.3666601

Dielectrophoretically formed single wall carbon nanotube network on polyether sulfone. / Kim, Tae Geun; Hwang, J. S.; Kang, J.; Kim, Sangsig; Roth, S.; Dettlaff-Weglikowska, U.; Hwang, S. W.

AIP Conference Proceedings. Vol. 1399 2011. p. 765-766.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kim, TG, Hwang, JS, Kang, J, Kim, S, Roth, S, Dettlaff-Weglikowska, U & Hwang, SW 2011, Dielectrophoretically formed single wall carbon nanotube network on polyether sulfone. in AIP Conference Proceedings. vol. 1399, pp. 765-766, 30th International Conference on the Physics of Semiconductors, ICPS-30, Seoul, Korea, Republic of, 10/7/25. https://doi.org/10.1063/1.3666601
Kim TG, Hwang JS, Kang J, Kim S, Roth S, Dettlaff-Weglikowska U et al. Dielectrophoretically formed single wall carbon nanotube network on polyether sulfone. In AIP Conference Proceedings. Vol. 1399. 2011. p. 765-766 https://doi.org/10.1063/1.3666601
Kim, Tae Geun ; Hwang, J. S. ; Kang, J. ; Kim, Sangsig ; Roth, S. ; Dettlaff-Weglikowska, U. ; Hwang, S. W. / Dielectrophoretically formed single wall carbon nanotube network on polyether sulfone. AIP Conference Proceedings. Vol. 1399 2011. pp. 765-766
@inproceedings{22b543ac0b6f421283e2261b97c15364,
title = "Dielectrophoretically formed single wall carbon nanotube network on polyether sulfone",
abstract = "AC dielectrophoresis (DEP) is a useful method to fabricate single wall carbon nanotube (SWCNT) network structures on various kinds of substrates. We report on the fabrication of SWCNT networks with varying densities, on transparent and flexible polyether sulfone (PES) substrates by using DEP. From the scanning electron microscope observations and current-voltage measurements of the fabricated SWCNT network, we obtain the contour map of the density and conductance as functions of V p-p and f. Our results show that the maximum density does not necessarily imply the maximum conductance. We find that there exists an optimum density for the maximum conductance.",
keywords = "dielectrophoresis, flexible substrate, network, Single-wall carbon nanotube",
author = "Kim, {Tae Geun} and Hwang, {J. S.} and J. Kang and Sangsig Kim and S. Roth and U. Dettlaff-Weglikowska and Hwang, {S. W.}",
year = "2011",
month = "12",
day = "1",
doi = "10.1063/1.3666601",
language = "English",
isbn = "9780735410022",
volume = "1399",
pages = "765--766",
booktitle = "AIP Conference Proceedings",

}

TY - GEN

T1 - Dielectrophoretically formed single wall carbon nanotube network on polyether sulfone

AU - Kim, Tae Geun

AU - Hwang, J. S.

AU - Kang, J.

AU - Kim, Sangsig

AU - Roth, S.

AU - Dettlaff-Weglikowska, U.

AU - Hwang, S. W.

PY - 2011/12/1

Y1 - 2011/12/1

N2 - AC dielectrophoresis (DEP) is a useful method to fabricate single wall carbon nanotube (SWCNT) network structures on various kinds of substrates. We report on the fabrication of SWCNT networks with varying densities, on transparent and flexible polyether sulfone (PES) substrates by using DEP. From the scanning electron microscope observations and current-voltage measurements of the fabricated SWCNT network, we obtain the contour map of the density and conductance as functions of V p-p and f. Our results show that the maximum density does not necessarily imply the maximum conductance. We find that there exists an optimum density for the maximum conductance.

AB - AC dielectrophoresis (DEP) is a useful method to fabricate single wall carbon nanotube (SWCNT) network structures on various kinds of substrates. We report on the fabrication of SWCNT networks with varying densities, on transparent and flexible polyether sulfone (PES) substrates by using DEP. From the scanning electron microscope observations and current-voltage measurements of the fabricated SWCNT network, we obtain the contour map of the density and conductance as functions of V p-p and f. Our results show that the maximum density does not necessarily imply the maximum conductance. We find that there exists an optimum density for the maximum conductance.

KW - dielectrophoresis

KW - flexible substrate

KW - network

KW - Single-wall carbon nanotube

UR - http://www.scopus.com/inward/record.url?scp=84862781082&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84862781082&partnerID=8YFLogxK

U2 - 10.1063/1.3666601

DO - 10.1063/1.3666601

M3 - Conference contribution

SN - 9780735410022

VL - 1399

SP - 765

EP - 766

BT - AIP Conference Proceedings

ER -