Diffusion induced grain-boundary migration in SrO-doped CeO2 electrolyte and its effect on electrical properties

Pyeong Seok Cho, Seung Young Park, Jeong Joo Kim, Hyoung Seok Do, Hyun Min Park, Jong Heun Lee

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Diffusion induced grain-boundary migration (DIGM) was observed when 4 and 9 mol% SrO-doped CeO2 (SrDC) ceramics were heat-treated at 1300 °C after sintering at 1600 °C. In the 9 mol% SrDC specimen, the curvature and distance of boundary migration were increased significantly as the heat-treatment time was increased from 10 min to 10 h at 1300 °C. This induced a ~ 2.9-fold increase of the apparent grain-boundary resistivity, which was explained by the physico-chemical change of the grain-boundary structure and/or the current constriction effect due to the undulated boundary morphology.

Original languageEnglish
Pages (from-to)1420-1424
Number of pages5
JournalSolid State Ionics
Volume181
Issue number31-32
DOIs
Publication statusPublished - 2010 Oct 7

    Fingerprint

Keywords

  • Complex Impedance Spectroscopy
  • Diffusion induced grain-boundary migration
  • Grain-boundary conduction
  • SrO-doped CeO

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Chemistry(all)

Cite this