Direct attachment of carbon nanotube on scanning probe tip using dielectrophoresis

Chang-Soo Han, Hyung Woo Lee, Sung Hun Ryu, Soo Hyun Kim, Yoon Keun Kwak

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

We found the simple, effective and low-cost fabrication method of scanning probe tip with carbon nanotube. The assembling apparatus has been discussed and a plausible explanation about attachment mechanism based on dielectrophoretic force has been suggested. In order to find the proper assembling condition, electric field analysis for the round shape tip has been accomplished. Using this condition, the scanning probe tips with carbon nanotube were fabricated at 25% success rate.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsD.V. Nicolau, U.R. Muller, J.M. Dell
Pages239-246
Number of pages8
Volume5275
DOIs
Publication statusPublished - 2004
Externally publishedYes
EventBioMEMS and Nanotechnology - Perth, WA, Australia
Duration: 2003 Dec 102003 Dec 12

Other

OtherBioMEMS and Nanotechnology
CountryAustralia
CityPerth, WA
Period03/12/1003/12/12

Fingerprint

Electrophoresis
attachment
Carbon nanotubes
carbon nanotubes
assembling
Scanning
scanning
probes
Electric fields
Fabrication
Costs
fabrication
electric fields

Keywords

  • Carbon nanotube
  • Dielectrophoresis
  • Scanning probe microscope

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Han, C-S., Lee, H. W., Ryu, S. H., Kim, S. H., & Kwak, Y. K. (2004). Direct attachment of carbon nanotube on scanning probe tip using dielectrophoresis. In D. V. Nicolau, U. R. Muller, & J. M. Dell (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 5275, pp. 239-246) https://doi.org/10.1117/12.529801

Direct attachment of carbon nanotube on scanning probe tip using dielectrophoresis. / Han, Chang-Soo; Lee, Hyung Woo; Ryu, Sung Hun; Kim, Soo Hyun; Kwak, Yoon Keun.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / D.V. Nicolau; U.R. Muller; J.M. Dell. Vol. 5275 2004. p. 239-246.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Han, C-S, Lee, HW, Ryu, SH, Kim, SH & Kwak, YK 2004, Direct attachment of carbon nanotube on scanning probe tip using dielectrophoresis. in DV Nicolau, UR Muller & JM Dell (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 5275, pp. 239-246, BioMEMS and Nanotechnology, Perth, WA, Australia, 03/12/10. https://doi.org/10.1117/12.529801
Han C-S, Lee HW, Ryu SH, Kim SH, Kwak YK. Direct attachment of carbon nanotube on scanning probe tip using dielectrophoresis. In Nicolau DV, Muller UR, Dell JM, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 5275. 2004. p. 239-246 https://doi.org/10.1117/12.529801
Han, Chang-Soo ; Lee, Hyung Woo ; Ryu, Sung Hun ; Kim, Soo Hyun ; Kwak, Yoon Keun. / Direct attachment of carbon nanotube on scanning probe tip using dielectrophoresis. Proceedings of SPIE - The International Society for Optical Engineering. editor / D.V. Nicolau ; U.R. Muller ; J.M. Dell. Vol. 5275 2004. pp. 239-246
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