Direct attachment of carbon nanotube on scanning probe tip using dielectrophoresis

Chang Soo Han; Hyung Woo Lee; Sung Hun Ryu; Soo Hyun Kim; Yoon Keun Kwak

doi:10.1117/12.529801

Direct attachment of carbon nanotube on scanning probe tip using dielectrophoresis

Chang Soo Han, Hyung Woo Lee, Sung Hun Ryu, Soo Hyun Kim, Yoon Keun Kwak

Research output: Contribution to journal › Conference article › peer-review

5 Citations (Scopus)

Abstract

We found the simple, effective and low-cost fabrication method of scanning probe tip with carbon nanotube. The assembling apparatus has been discussed and a plausible explanation about attachment mechanism based on dielectrophoretic force has been suggested. In order to find the proper assembling condition, electric field analysis for the round shape tip has been accomplished. Using this condition, the scanning probe tips with carbon nanotube were fabricated at 25% success rate.

Original language	English
Pages (from-to)	239-246
Number of pages	8
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	5275
DOIs	https://doi.org/10.1117/12.529801
Publication status	Published - 2004
Externally published	Yes
Event	BioMEMS and Nanotechnology - Perth, WA, Australia Duration: 2003 Dec 10 → 2003 Dec 12

Keywords

Carbon nanotube
Dielectrophoresis
Scanning probe microscope

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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@article{a5584ee3ac2245dfb10ac0d5c8863dd4,

title = "Direct attachment of carbon nanotube on scanning probe tip using dielectrophoresis",

abstract = "We found the simple, effective and low-cost fabrication method of scanning probe tip with carbon nanotube. The assembling apparatus has been discussed and a plausible explanation about attachment mechanism based on dielectrophoretic force has been suggested. In order to find the proper assembling condition, electric field analysis for the round shape tip has been accomplished. Using this condition, the scanning probe tips with carbon nanotube were fabricated at 25% success rate.",

keywords = "Carbon nanotube, Dielectrophoresis, Scanning probe microscope",

author = "Han, {Chang Soo} and Lee, {Hyung Woo} and Ryu, {Sung Hun} and Kim, {Soo Hyun} and Kwak, {Yoon Keun}",

year = "2004",

doi = "10.1117/12.529801",

language = "English",

volume = "5275",

pages = "239--246",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "BioMEMS and Nanotechnology ; Conference date: 10-12-2003 Through 12-12-2003",

}

TY - JOUR

T1 - Direct attachment of carbon nanotube on scanning probe tip using dielectrophoresis

AU - Han, Chang Soo

AU - Lee, Hyung Woo

AU - Ryu, Sung Hun

AU - Kim, Soo Hyun

AU - Kwak, Yoon Keun

PY - 2004

Y1 - 2004

N2 - We found the simple, effective and low-cost fabrication method of scanning probe tip with carbon nanotube. The assembling apparatus has been discussed and a plausible explanation about attachment mechanism based on dielectrophoretic force has been suggested. In order to find the proper assembling condition, electric field analysis for the round shape tip has been accomplished. Using this condition, the scanning probe tips with carbon nanotube were fabricated at 25% success rate.

AB - We found the simple, effective and low-cost fabrication method of scanning probe tip with carbon nanotube. The assembling apparatus has been discussed and a plausible explanation about attachment mechanism based on dielectrophoretic force has been suggested. In order to find the proper assembling condition, electric field analysis for the round shape tip has been accomplished. Using this condition, the scanning probe tips with carbon nanotube were fabricated at 25% success rate.

KW - Carbon nanotube

KW - Dielectrophoresis

KW - Scanning probe microscope

UR - http://www.scopus.com/inward/record.url?scp=2442619019&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=2442619019&partnerID=8YFLogxK

U2 - 10.1117/12.529801

DO - 10.1117/12.529801

M3 - Conference article

AN - SCOPUS:2442619019

VL - 5275

SP - 239

EP - 246

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

T2 - BioMEMS and Nanotechnology

Y2 - 10 December 2003 through 12 December 2003

ER -

Direct attachment of carbon nanotube on scanning probe tip using dielectrophoresis

Abstract

Keywords

ASJC Scopus subject areas

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