Direct Measurement of Ion Diffusivity in Oxide Thin Film by Using Isotope Tracers and Secondary Ion Mass Spectrometry

Engineering & Materials Science

• Secondary ion mass spectrometry 100%
• Oxide films 82%
• Isotopes 81%
• Tracers 77%
• Yttria stabilized zirconia 74%
• Thin films 62%
• Ions 61%
• Oxides 28%
• Pulsed laser deposition 17%
• Epitaxial growth 15%
• Focused ion beams 15%
• Crystalline materials 11%
• Aluminum oxide 10%
• Oxygen 8%

Chemical Compounds

• Secondary Ion Mass Spectroscopy 72%
• Diffusion 41%
• Oxide 35%
• Ion 26%
• Surface 21%
• Pulsed Laser Deposition 17%
• Epitaxial Growth 16%
• Time-of-Flight Secondary Ion Mass Spectrometry 16%
• Ion Beam 14%
• Block Like Crystal 9%
• Environment 7%
• Dioxygen 6%

Business & Economics

• Exchange Rates 18%
• Laser 15%