Displacement measurement using an optoelectronic oscillator with an intra-loop Michelson interferometer

Jehyun Lee, Sooyoung Park, Dae Han Seo, Sin Hyuk Yim, Seokchan Yoon, Donghyun Cho

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

We report on measurement of small displacements with sub-nanometer precision using an optoelectronic oscillator (OEO) with an intra-loop Michelson interferometer. In comparison with conventional homodyne and heterodyne detection methods, where displacement appears as a power change or a phase shift, respectively, in the OEO detection, the displacement produces a shift in the oscillation frequency. In comparison with typical OEO sensors, where the frequency shift is proportional to the OEO oscillation frequency in radio-frequency domain, the frequency shift in our method with an intra-loop interferometer is proportional to an optical frequency. We constructed a hybrid apparatus and compared characteristics of the OEO and heterodyne detection methods.

Original languageEnglish
Pages (from-to)21910-21920
Number of pages11
JournalOptics Express
Volume24
Issue number19
DOIs
Publication statusPublished - 2016 Sep 19

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displacement measurement
Michelson interferometers
oscillators
frequency shift
oscillations
radio frequencies
phase shift
interferometers
shift
sensors

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Displacement measurement using an optoelectronic oscillator with an intra-loop Michelson interferometer. / Lee, Jehyun; Park, Sooyoung; Seo, Dae Han; Yim, Sin Hyuk; Yoon, Seokchan; Cho, Donghyun.

In: Optics Express, Vol. 24, No. 19, 19.09.2016, p. 21910-21920.

Research output: Contribution to journalArticle

Lee, Jehyun ; Park, Sooyoung ; Seo, Dae Han ; Yim, Sin Hyuk ; Yoon, Seokchan ; Cho, Donghyun. / Displacement measurement using an optoelectronic oscillator with an intra-loop Michelson interferometer. In: Optics Express. 2016 ; Vol. 24, No. 19. pp. 21910-21920.
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