Displacement measurement using an optoelectronic oscillator with an intra-loop Michelson interferometer

Jehyun Lee, Sooyoung Park, Dae Han Seo, Sin Hyuk Yim, Seokchan Yoon, Donghyun Cho

Research output: Contribution to journalArticle

10 Citations (Scopus)

Abstract

We report on measurement of small displacements with sub-nanometer precision using an optoelectronic oscillator (OEO) with an intra-loop Michelson interferometer. In comparison with conventional homodyne and heterodyne detection methods, where displacement appears as a power change or a phase shift, respectively, in the OEO detection, the displacement produces a shift in the oscillation frequency. In comparison with typical OEO sensors, where the frequency shift is proportional to the OEO oscillation frequency in radio-frequency domain, the frequency shift in our method with an intra-loop interferometer is proportional to an optical frequency. We constructed a hybrid apparatus and compared characteristics of the OEO and heterodyne detection methods.

Original languageEnglish
Pages (from-to)21910-21920
Number of pages11
JournalOptics Express
Volume24
Issue number19
DOIs
Publication statusPublished - 2016 Sep 19

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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