Dual-Wavelength Diffraction Phase Microscopy with 170 Times Larger Image Area

Behnam Tayebi, Yeonwoo Jeong, Jae Ho Han

Research output: Contribution to journalArticle

3 Citations (Scopus)


Image area for multiple-color 3D off-axis interferometry is extremely restricted because of the Nyquist sampling rate, autocorrelation term, and twin cross-correlation term in the frequency domain for each wavelength. Furthermore, image area is more restricted in dual-wavelength diffraction phase microscopy, which is an important tool for 3D biological imaging with sub-nanometer sensitivity. The reason for this extra restriction is the use of only one pinhole for generating two uniform reference beams which is not sufficient for imaging large areas. Here, we developed large field-of-view double-pinhole dual-wavelength diffraction phase microscopy as a novel approach to capture maximum possible information using two arbitrary wavelengths in the off-axis arrangement. The rules to optimize the 2D sampling scheme without any crosstalk for two arbitrary wavelengths are theoretically presented. We demonstrate that the loss in the image area of the dual-wavelength holographic system designed with this approach is limited to 0-11% of the maximum possible image area using single-wavelength off-axis interferometry. Total amount of information is more than 170 times that of previously reported dual-wavelength diffraction phase microscopy employing single grating, single pinhole, and no sampling scheme optimization. Feasibility of the technique with sub-nanometer sensitivity is demonstrated by measuring optical thickness of polystyrene microspheres.

Original languageEnglish
JournalIEEE Journal of Selected Topics in Quantum Electronics
Publication statusAccepted/In press - 2018 Aug 3


  • biophotonics
  • color imaging
  • Correlation
  • Frequency modulation
  • Frequency-domain analysis
  • Holography
  • holography
  • Microscopy
  • Phase modulation

ASJC Scopus subject areas

  • Ceramics and Composites
  • Atomic and Molecular Physics, and Optics
  • Materials Chemistry
  • Electrical and Electronic Engineering

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