Effect of basal-plane stacking faults on X-ray diffraction of non-polar (1120) a-plane GaN films grown on (1102) r-plane sapphire substrates

Ji Hoon Kim, Sung Min Hwang, Kwang Hyeon Baik, Jung Ho Park

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

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Engineering & Materials Science

Chemical Compounds