Effect of different front metal design on efficiency affected by series resistance and short circuit current density in crystalline silicon solar cell

Sujeong Jeong, Seunghyun Shin, Dongjin Choi, Soohyun Bae, Yoon Mook Kang, Haeseok Lee, Donghwan Kim

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

In commercial solar cells, the pattern of the front electrode is critical to effectively assemble the photo generated current. The power loss in solar cells caused by the front electrode was categorized as four types. First, losses due to the metallic resistance of the electrode. Second, losses due to the contact resistance of the electrode and emitter. Third, losses due to the emitter resistance when current flows through the emitter. Fourth, losses due to the shading effect of the front metal electrode, which has a high reflectance. In this paper, optimizing the number of finger on a 4 × 4 solar cell is demonstrated with known theory. We compared the short circuit current density and fill factor to evaluate the power loss from the front metal contact calculation result. By experiment, the short circuit current density(Jsc), taken in each pattern as 37.61, 37.53, and 37.38 mA/ cm2 decreased as the number of fingers increased. The fill factor(FF), measured in each pattern as 0.7745, 0.7782 and 0.7843 increased as number of fingers increased. The results suggested that the efficiency(Eff) was measured in each pattern as 17.51, 17.81, and 17.84 %. Throughout this study, the short-circuit current densities(Jsc) and fill factor(FF) varied according to the number of fingers in the front metal pattern. The effects on the efficiency of the two factors were also investigated.

Original languageEnglish
Pages (from-to)518-523
Number of pages6
JournalKorean Journal of Materials Research
Volume27
Issue number10
DOIs
Publication statusPublished - 2017 Jan 1

Keywords

  • Front metal pattern
  • Power loss analysis
  • Resistance loss
  • Shading loss

ASJC Scopus subject areas

  • Materials Science(all)

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