Effect of extended defects in planar and pixelated CdZnTe detectors

G. S. Camarda, K. W. Andreini, A. E. Bolotnikov, Y. Cui, A. Hossain, R. Gul, K. H. Kim, L. Marchini, L. Xu, G. Yang, J. E. Tkaczyk, R. B. James

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