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Effect of interface roughness on magnetoresistance and magnetization switching in double-barrier magnetic tunnel junction
J. Y. Hwang, S. Y. Lee, N. I. Lee, H. I. Yim, M. Y. Kim, W. C. Lee, J. R. Rhee, B. S. Chun, T. W. Kim, Y. K. Kim, S. S. Lee, D. G. Hwang, E. J. Ri
Research output: Contribution to journal › Article › peer-review
2
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(Scopus)