Effect of interface roughness on magnetoresistance and magnetization switching in double-barrier magnetic tunnel junction

J. Y. Hwang, S. Y. Lee, N. I. Lee, H. I. Yim, M. Y. Kim, W. C. Lee, J. R. Rhee, B. S. Chun, T. W. Kim, Y. K. Kim, S. S. Lee, D. G. Hwang, E. J. Ri

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Engineering & Materials Science

Chemical Compounds